Lumped-Model Analysis of Microcircuit Vulnerability

IEEE Transactions on Nuclear Science ◽

10.1109/tns.1968.4325057 ◽

1968 ◽

Vol 15 (6) ◽

pp. 271-278 ◽

Author(s):

J. P. Raymond ◽

W. W. Chang ◽

R. E. Budris

Keyword(s):

Model Analysis ◽

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Lumped Model Analysis of Semiconductor Devices Using the NET-2 Circuit/System Analysis Program

IEEE Transactions on Nuclear Science ◽

10.1109/tns.1972.4326816 ◽

1972 ◽

Vol 19 (6) ◽

pp. 103-107 ◽

Author(s):

J. P. Raymond ◽

M. G. Krebs

Keyword(s):

System Analysis ◽

Semiconductor Devices ◽

Model Analysis ◽

Analysis Program ◽

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Clearance and lubricant selection for avoiding seizure in a circumferential groove journal bearing based on a lumped model analysis

Mécanique & Industries ◽

10.1051/meca/2011135 ◽

2011 ◽

Vol 12 (5) ◽

pp. 399-408 ◽

Author(s):

Alex-Florian Cristea ◽

Mircea Pascovici ◽

Michel Fillon

Keyword(s):

Journal Bearing ◽

Model Analysis ◽

Lumped Model ◽

Circumferential Groove ◽

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Lumped model analysis of the low frequency generation noise in gold-doped silicon junction-gate field-effect transistors

Solid-State Electronics ◽

10.1016/0038-1101(69)90034-3 ◽

1969 ◽

Vol 12 (8) ◽

pp. 605-618 ◽

Author(s):

H.S. Fu ◽

C.T. Sah

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Low Frequency ◽

Model Analysis ◽

Lumped Model ◽

Doped Silicon ◽

Frequency Generation

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A lumped model analysis of noise in semiconductor devices

IRE Transactions on Electron Devices ◽

10.1109/t-ed.1959.14464 ◽

1959 ◽

Vol 6 (2) ◽

pp. 133-140 ◽

Author(s):

R.N. Beatie

Keyword(s):

Semiconductor Devices ◽

Model Analysis ◽

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Numerical Study of Depressurization Rate during Blowdown Based on Lumped Model Analysis

Journal of Nuclear Science and Technology ◽

10.1080/18811248.1984.9731135 ◽

1984 ◽

Vol 21 (12) ◽

pp. 931-941 ◽

Author(s):

Takashi IKEDA ◽

Atsuo YAMANOUCHI ◽

Isao SUMIDA

Keyword(s):

Numerical Study ◽

Model Analysis ◽

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Detailed Lumped-Model Analysis of Transistor Ionizing Radiation Effects

IEEE Transactions on Nuclear Science ◽

10.1109/tns.1996.4324350 ◽

1966 ◽

Vol 13 (6) ◽

pp. 95-104 ◽

Author(s):

James P. Raymond ◽

Robert E. Johnson

Keyword(s):

Ionizing Radiation ◽

Radiation Effects ◽

Model Analysis ◽

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Lumped model analysis of semiconductor devices using the NET-2 circuit/system analysis program

Computer-Aided Design ◽

10.1016/0010-4485(73)90033-x ◽

1973 ◽

Vol 5 (2) ◽

pp. 131

Keyword(s):

System Analysis ◽

Semiconductor Devices ◽

Model Analysis ◽

Analysis Program ◽

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Supplemental Material for Understanding HIV Transmission Risk Behavior Among HIV-Infected South Africans Receiving Antiretroviral Therapy: An Information—Motivation—Behavioral Skills Model Analysis

Health Psychology ◽

10.1037/a0030554.supp ◽

2013 ◽

Keyword(s):

Antiretroviral Therapy ◽

Risk Behavior ◽

Hiv Transmission ◽

Model Analysis ◽

Transmission Risk ◽

Behavioral Skills ◽

South Africans ◽

Hiv Transmission Risk

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Supplemental Material for A Bayesian Latent-Mixture Model Analysis Shows That Informative Samples Reduce Base-Rate Neglect

Decision ◽

10.1037/dec0000024.supp ◽

2014 ◽

Keyword(s):

Mixture Model ◽

Model Analysis ◽

Base Rate ◽

Base Rate Neglect

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A Diffusion Model Analysis of Developmental Changes in Number Processing

PsycEXTRA Dataset ◽

10.1037/e502412013-198 ◽

2012 ◽

Author(s):

Roger Ratcliff ◽

Clarissa A. Thompson ◽

Gail McKoon

Keyword(s):

Diffusion Model ◽

Model Analysis ◽

Number Processing ◽

Developmental Changes

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