Verification of Single Event Upset Rate Estimation Methods with On-Orbit Observations

IEEE Transactions on Nuclear Science ◽

10.1109/tns.1987.4337462 ◽

1987 ◽

Vol 34 (6) ◽

pp. 1256-1261 ◽

Author(s):

M. Shoga ◽

P. Adams ◽

D. L. Chenette ◽

R. Koga ◽

E. C. Smith

Keyword(s):

Estimation Methods ◽

Single Event Upset ◽

Single Event ◽

Rate Estimation

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Single Event Upset tests and failure rate estimation for a front-end ASIC adopted in high-flux-particle therapy applications

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2018.11.106 ◽

2019 ◽

Vol 918 ◽

pp. 54-59

Author(s):

F. Fausti ◽

G. Mazza ◽

S. Giordanengo ◽

O.H. Ali ◽

L. Manganaro ◽

...

Keyword(s):

Failure Rate ◽

Particle Therapy ◽

High Flux ◽

Single Event Upset ◽

Single Event ◽

Rate Estimation ◽

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Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e99.a.1198 ◽

2016 ◽

Vol E99.A (6) ◽

pp. 1198-1205

Author(s):

Go MATSUKAWA ◽

Yuta KIMI ◽

Shuhei YOSHIDA ◽

Shintaro IZUMI ◽

Hiroshi KAWAGUCHI ◽

...

Keyword(s):

Error Propagation ◽

Single Event Upset ◽

Single Event ◽

Propagation Analysis ◽

Error Propagation Analysis

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A gate-level model for single-event upset simulation

Future Communication Technology ◽

10.2495/icct130431 ◽

2014 ◽

Author(s):

Lei Li ◽

Ran Dai

Keyword(s):

Single Event Upset ◽

Single Event ◽

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SEU (Single Event Upset) Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors,

10.21236/ada176094 ◽

1986 ◽

Author(s):

R. Koga ◽

W. A. Kolasinski ◽

C. King ◽

J. Cusick

Keyword(s):

Single Event Upset ◽

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New Solar Flare Particle Environment Models and Titan/Centaur INU Multiple-Bit Single Event Upset Rates.

10.21236/ada302779 ◽

1995 ◽

Author(s):

T. J. Lie ◽

W. A. Kolasinski

Keyword(s):

Solar Flare ◽

Single Event Upset ◽

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Conductive Filament Variation of RRAM and Its Impact on Single Event Upset

Transactions on Electrical and Electronic Materials ◽

10.1007/s42341-021-00343-y ◽

2021 ◽

Author(s):

H. M. Vijay ◽

V. N. Ramakrishnan

Keyword(s):

Single Event Upset ◽

Single Event ◽

Conductive Filament

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Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

Journal of Electronic Testing ◽

10.1007/s10836-021-05940-6 ◽

2021 ◽

Author(s):

Shuting Shi ◽

Rui Chen ◽

Rui Liu ◽

Mo Chen ◽

Chen Shen ◽

...

Keyword(s):

Single Event Upset ◽

Single Event ◽

Arm Processor ◽

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Impact of heavy ion energy and species on single-event upset in commercial floating gate cells

Microelectronics Reliability ◽

10.1016/j.microrel.2021.114128 ◽

2021 ◽

Vol 120 ◽

pp. 114128

Author(s):

Bing Ye ◽

Li-Hua Mo ◽

Peng-Fei Zhai ◽

Li Cai ◽

Tao Liu ◽

...

Keyword(s):

Heavy Ion ◽

Floating Gate ◽

Single Event Upset ◽

Single Event ◽

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An Investigation of Single Event Upset Hardened SRAM Bit Cells

2021 International Conference on Advances in Electrical, Computing, Communication and Sustainable Technologies (ICAECT) ◽

10.1109/icaect49130.2021.9392571 ◽

2021 ◽

Author(s):

Dharmendrakumar Patel ◽

Nagendra Gajjar

Keyword(s):

Single Event Upset ◽

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Single Event Upset Results from the Radiation Hardened Electronic Memory Experiment in a Polar Orbit

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) ◽

10.1109/redw51883.2020.9325847 ◽

2020 ◽

Author(s):

David Alexander ◽

Alonzo Vera ◽

Jeff Love ◽

Wesley Morris ◽

David Gifford ◽

...

Keyword(s):

Single Event Upset ◽

Single Event ◽

Polar Orbit ◽

Memory Experiment ◽

Radiation Hardened

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