scholarly journals Monte-Carlo Based On-Orbit Single Event Upset Rate Prediction for a Radiation Hardened by Design Latch

2007 ◽  
Vol 54 (6) ◽  
pp. 2419-2425 ◽  
Author(s):  
Kevin M. Warren ◽  
Brian D. Sierawski ◽  
Robert A. Reed ◽  
Robert A. Weller ◽  
Carl Carmichael ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Single Event Upset ◽  
Single Event ◽  
Rate Prediction ◽  
Radiation Hardened ◽  
Radiation Hardened By Design

Integrating Circuit Level Simulation and Monte-Carlo Radiation Transport Code for Single Event Upset Analysis in SEU Hardened Circuitry

2008 ◽  
Vol 55 (6) ◽  
pp. 2886-2894 ◽  
Author(s):  
Kevin M. Warren ◽  
Andrew L. Sternberg ◽  
Robert A. Weller ◽  
Mark P. Baze ◽  
Lloyd W. Massengill ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Radiation Transport ◽  
Single Event Upset ◽  
Single Event ◽  
Transport Code

A SEE Hardened Read-Out Circuit of EEPROM for Space Application

2012 ◽  
Vol 198-199 ◽  
pp. 1105-1109
Author(s):  
Xin Jie Zhou ◽  
Jing He Wei ◽  
Lei Lei Li
Keyword(s):  
Circuit Design ◽  
Space Application ◽  
Single Event Upset ◽  
Single Event ◽  
Single Event Transient ◽  
Single Event Effect ◽  
Radiation Hardened

As wide application of EEPROM devices in space and military field, more and more researches focus on its radiation hardened characteristics in international. To improve the single-event effect (SEE) tolerant ability of read-out circuits in the memory, a radiation hardened circuit is designed. The design kernels of radiation hardened latch-flip are given and designed to resist the single-event upset (SEU) effect. A correction circuit is proposed to resist the single-event transient (SET) effect. The performances of this design are: SEU (LET)th ≥ 27 MeV•cm2/mg, SEL(LET)th ≥ 75 MeV•cm2/mg , read out time ≤200 ns. The new design not only satisfied the needs of present work, but supplies a worthful reference for radiation hardened circuit design in future.

Predicting the Single-Event Error Rate of a Radiation Hardened by Design Microprocessor

2011 ◽  
Vol 58 (6) ◽  
pp. 2726-2733 ◽  
Author(s):  
Manuel Cabanas-Holmen ◽  
Ethan H. Cannon ◽  
Tony Amort ◽  
Jon Ballast ◽  
Roger Brees ◽  
...  
Keyword(s):  
Error Rate ◽  
Single Event ◽  
Radiation Hardened ◽  
Radiation Hardened By Design

Single-Event Transient Error Characterization of a Radiation-Hardened by Design 90 nm SerDes Transmitter Driver

2009 ◽  
Vol 56 (6) ◽  
pp. 3463-3468 ◽  
Author(s):  
S. E. Armstrong ◽  
B. D. Olson ◽  
J. Popp ◽  
J. Braatz ◽  
T. D. Loveless ◽  
...  
Keyword(s):  
Single Event ◽  
Single Event Transient ◽  
Error Characterization ◽  
Radiation Hardened ◽  
Transient Error ◽  
Radiation Hardened By Design
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