Development of Radiation Hardened By Design (RHBD) of NAND gate to mitigate the effects of single event transients (SET)
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2009 ◽
Vol 30
(12)
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pp. 125009
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2011 ◽
Vol 58
(6)
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pp. 2726-2733
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2009 ◽
Vol 56
(6)
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pp. 3463-3468
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2007 ◽
Vol 54
(6)
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pp. 2419-2425
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2012 ◽
Vol 52
(6)
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pp. 1227-1232
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2012 ◽
Vol 33
(10)
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pp. 105007
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