Radiation-Tolerant Code-Density Calibration of Nyquist-Rate Analog-to-Digital Converters

Analog To Digital ◽

Nyquist Rate ◽

Radiation Tolerant ◽

2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record (NSS/MIC) ◽

Code-density calibration of Nyquist-rate analog-to-digital converters

10.1109/nssmic.2012.6551183 ◽

2012 ◽

Author(s):

Carl R. Grace ◽

Peter Denes ◽

Dario Gnani ◽

Henrik von der Lippe ◽

Jean-Pierre Walder

Keyword(s):

Analog To Digital ◽

Nyquist Rate ◽

Online Calibration of a Nyquist-Rate Analog-to-Digital Converter Using Output Code-Density Histograms

IEEE Transactions on Circuits and Systems I Fundamental Theory and Applications ◽

10.1109/tcsi.2003.821279 ◽

2004 ◽

Vol 51 (1) ◽

pp. 15-24 ◽

Cited By ~ 24

Author(s):

U. Eduri ◽

F. Maloberti

Keyword(s):

Analog To Digital Converter ◽

Digital Converter ◽

Analog To Digital ◽

Online Calibration ◽

Output Code ◽

Nyquist Rate ◽

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal

25th IEEE VLSI Test Symmposium (VTS'07) ◽

10.1109/vts.2007.23 ◽

2007 ◽

Cited By ~ 5

Author(s):

Le Jin ◽

Degang Chen ◽

Randall Geiger

Keyword(s):

Analog To Digital ◽

Nyquist Rate Analog to Digital Converters

Data Converters ◽

10.1007/978-0-387-32486-9_4 ◽

2007 ◽

pp. 141-208

Keyword(s):

Analog To Digital ◽

Nyquist Rate

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2009.2015700 ◽

2009 ◽

Vol 58 (8) ◽

pp. 2679-2685 ◽

Cited By ~ 12

Author(s):

Le Jin ◽

Degang Chen ◽

R.L. Geiger

Keyword(s):

Analog To Digital ◽

On the Signature Analysis of Analog-to-Digital Converters

i-manager’s Journal on Software Engineering ◽

10.26634/jse.4.3.1117 ◽

2010 ◽

Vol 4 (3) ◽

pp. 44-49

Author(s):

Vadim Geurkov ◽

L. Kirischian

Keyword(s):

Signature Analysis ◽

Analog To Digital

CAD/EDA, MODELING AND SIMULATION IN MODERN ELECTRONICS: COLLECTION OF SCIENTIFIC PAPERS OF THE III INTERNATIONAL SCIENTIFIC AND PRACTICAL CONFERENCE ◽

MODELING OF ANALOG-TO-DIGITAL CONVERTERS IN THE MULTISIM

10.30987/conferencearticle_5e0282150b0a94.52925909 ◽

2019 ◽

Author(s):

Aleksandr Shtin

Keyword(s):

Electronic Devices ◽

Analog To Digital ◽

Functional Units

The report examined the features of modeling in Multisim such functional units of electronic devices as analog-to-digital converters.

An ICA Framework for Digital Background Calibration of Analog-to-Digital Converters

Sampling Theory, Signal Processing, and Data Analysis ◽

10.1007/bf03549557 ◽

2012 ◽

Vol 11 (2-3) ◽

pp. 253-270

Author(s):

Yun Chiu ◽

Seung-Chul Lee ◽

Wenbo Liu

Keyword(s):

Background Calibration ◽

Analog To Digital ◽

Digital Background Calibration

Design and Characterization of a Sampling System Based on $\Sigma$–$\Delta$ Analog-to-Digital Converters for Electrical Metrology

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2008.2010575 ◽

2009 ◽

Vol 58 (4) ◽

pp. 786-790 ◽

Cited By ~ 10

Author(s):

R. Iuzzolino ◽

L. Palafox ◽

W.G. Kurten Ihlenfeld ◽

E. Mohns ◽

C. Brendel

Keyword(s):

Sampling System ◽

Sigma Delta ◽

Analog To Digital

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) ◽

Phase-plane characterization of analog-to-digital converters

10.1109/imtc.2004.1351105 ◽

2004 ◽

Cited By ~ 1

Author(s):

C.L. Monteiro ◽

P. Arpaia ◽

A.C. Serra

Keyword(s):

Phase Plane ◽

Analog To Digital