scholarly journals Single Event Upsets Under 14-MeV Neutrons in a 28-nm SRAM-Based FPGA in Static Mode

2020 ◽  
Vol 67 (7) ◽  
pp. 1461-1469 ◽  
Author(s):  
Juan Carlos Fabero ◽  
Hortensia Mecha ◽  
Francisco J. Franco ◽  
Juan Antonio Clemente ◽  
Golnaz Korkian ◽  
...  
Keyword(s):  
Single Event ◽  
Static Mode ◽  
Single Event Upsets ◽  
28 Nm

Electron-Induced Single-Event Upsets in 45-nm and 28-nm Bulk CMOS SRAM-Based FPGAs Operating at Nominal Voltage

2015 ◽  
Vol 62 (6) ◽  
pp. 2717-2724 ◽  
Author(s):  
Matthew J. Gadlage ◽  
Austin H. Roach ◽  
Adam R. Duncan ◽  
Mark W. Savage ◽  
Matthew J. Kay
Keyword(s):  
Single Event ◽  
Single Event Upsets ◽  
Nominal Voltage ◽  
28 Nm

scholarly journals Electron-Induced Single Event Upsets in 28 nm and 45 nm Bulk SRAMs

2015 ◽  
Vol 62 (6) ◽  
pp. 2709-2716 ◽  
Author(s):  
J. M. Trippe ◽  
R. A. Reed ◽  
R. A. Austin ◽  
B. D. Sierawski ◽  
R. A. Weller ◽  
...  
Keyword(s):  
Single Event ◽  
Single Event Upsets ◽  
28 Nm

Heavy Ions Induced Single Event Upsets Testing of the 28 nm Xilinx Zynq-7000 All Programmable SoC

2015 ◽  
Author(s):  
Lucas Antunes Tambara ◽  
Fernanda Lima Kastensmidt ◽  
Nilberto H. Medina ◽  
Nemitala Added ◽  
Vitor A. P. Aguiar ◽  
...  
Keyword(s):  
Heavy Ions ◽  
Single Event ◽  
Single Event Upsets ◽  
28 Nm

scholarly journals Measurements and Simulations of Single-Event Upsets in a 28-nm FPGA

2018 ◽  
Author(s):  
Markus Preston ◽  
Per-Erik Tegnér ◽  
Hans Calén ◽  
Tord Johansson ◽  
Karoly Makónyi ◽  
...  
Keyword(s):  
Single Event ◽  
Single Event Upsets ◽  
28 Nm

Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor

2021 ◽  
Author(s):  
Shuting Shi ◽  
Rui Chen ◽  
Rui Liu ◽  
Mo Chen ◽  
Chen Shen ◽  
...  
Keyword(s):  
Single Event Upset ◽  
Single Event ◽  
Arm Processor ◽  
28 Nm

Neutron and proton-induced single event upsets in advanced commercial fully depleted SOI SRAMs

2005 ◽  
Vol 52 (6) ◽  
pp. 2319-2325 ◽  
Author(s):  
J. Baggio ◽  
V. Ferlet-Cavrois ◽  
D. Lambert ◽  
P. Paillet ◽  
F. Wrobel ◽  
...  
Keyword(s):  
Single Event ◽  
Fully Depleted ◽  
Single Event Upsets
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