Measurement and Characterization Technique for Real-Time Die Temperature Prediction of MOSFET-Based Power Electronics
2016 ◽
Vol 31
(6)
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pp. 4378-4388
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2016 ◽
Vol 31
(4)
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pp. 2709-2719
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2021 ◽
Keyword(s):
2019 ◽
Vol 6
(5)
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pp. 7375-7385
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