The DC Surface Flashover Performance Research of Polyimide Under Low-Energy Electron Irradiation Environment

IEEE Transactions on Plasma Science ◽

10.1109/tps.2015.2504598 ◽

2016 ◽

Vol 44 (1) ◽

pp. 85-92 ◽

Author(s):

Chenyang Liu ◽

Ying Zheng ◽

Pei Yang ◽

Xiaoquan Zheng ◽

Ying Li ◽

...

Keyword(s):

Electron Irradiation ◽

Energy Electron ◽

Surface Flashover ◽

Low Energy Electron ◽

Performance Research

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Surface flashover of dielectrics during low-energy electron irradiation in vacuum

Proceedings ISDEIV. 18th International Symposium on Discharges and Electrical Insulation in Vacuum (Cat. No.98CH36073) ◽

10.1109/deiv.1998.738896 ◽

2002 ◽

Author(s):

H. Fujii ◽

S. Hiro

Keyword(s):

Electron Irradiation ◽

Energy Electron ◽

Surface Flashover ◽

Low Energy Electron

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Effects of low-energy electron irradiation on submonolayer ammonia adsorbed on Pt(111)

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199802)26:2<97::aid-sia336>3.0.co;2-f ◽

1998 ◽

Vol 26 (2) ◽

pp. 97-104 ◽

Author(s):

C. Bater ◽

J. H. Campbell ◽

J. H. Craig

Keyword(s):

Electron Irradiation ◽

Energy Electron ◽

Low Energy Electron

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Methods for measurement of electron emission yield under low energy electron-irradiation by collector method and Kelvin probe method

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.3462039 ◽

2010 ◽

Vol 28 (5) ◽

pp. 1122-1125 ◽

Author(s):

Thomas Tondu ◽

Mohamed Belhaj ◽

Virginie Inguimbert

Keyword(s):

Electron Irradiation ◽

Electron Emission ◽

Probe Method ◽

Energy Electron ◽

Kelvin Probe ◽

Emission Yield ◽

Low Energy Electron ◽

Kelvin Probe Method

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Highly Conductive Carbon-Based Thin Films Produced by Low-Energy Electron Irradiation

Journal of Electronic Materials ◽

10.1007/s11664-021-09058-5 ◽

2021 ◽

Author(s):

C. C. Ciobotaru ◽

I. C. Ciobotaru ◽

D. G. Iosub ◽

S. Polosan

Keyword(s):

Electron Irradiation ◽

Energy Electron ◽

Low Energy Electron ◽

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Vacancy Defects Induced by Low Energy Electron Irradiation in 6H and 3C-SiC Monocrystals Characterized by Positron Annihilation Spectroscopy and Electron Paramagnetic Resonance

Silicon Carbide and Related Materials 2005 - Materials Science Forum ◽

10.4028/0-87849-425-1.571 ◽

2006 ◽

pp. 571-574

Author(s):

X. Kerbiriou ◽

Marie France Barthe ◽

S. Esnouf ◽

P. Desgardin ◽

G. Blondiaux ◽

...

Keyword(s):

Electron Paramagnetic Resonance ◽

Positron Annihilation ◽

Electron Irradiation ◽

Positron Annihilation Spectroscopy ◽

Energy Electron ◽

Paramagnetic Resonance ◽

Vacancy Defects ◽

Low Energy Electron ◽

Electron Paramagnetic

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Lifetime-Killing Defects in 4H-SiC Epilayers and Lifetime Control by Low-Energy Electron Irradiation

Silicon Carbide ◽

10.1002/9783527629053.ch10 ◽

2011 ◽

pp. 267-286 ◽

Author(s):

Tsunenobu Kimoto ◽

Katsunori Danno ◽

Jun Suda

Keyword(s):

Electron Irradiation ◽

Energy Electron ◽

Low Energy Electron

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Subthreshold Radiation Damage in Few-Layer Graphene Nanostructures Due to Low-Energy Electron Irradiation

10.9734/bpi/naer/v10/11530d ◽

2021 ◽

pp. 32-40

Author(s):

N. R. Guseinov ◽

A. M. Ilyin

Keyword(s):

Radiation Damage ◽

Electron Irradiation ◽

Energy Electron ◽

Layer Graphene ◽

Low Energy Electron ◽

Few Layer Graphene ◽

Graphene Nanostructures

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Low Energy Electron Irradiation Induced Charging of Dielectric Materials: Measurements and Analyses

2019 IEEE Pulsed Power & Plasma Science (PPPS) ◽

10.1109/ppps34859.2019.9009953 ◽

2019 ◽

Author(s):

M. Belhaj ◽

S. Dadouch

Keyword(s):

Electron Irradiation ◽

Dielectric Materials ◽

Energy Electron ◽

Low Energy Electron

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THE EFFECT OF LOW‐ENERGY ELECTRON IRRADIATION OF METAL‐OXIDE‐SEMICONDUCTOR STRUCTURES

Applied Physics Letters ◽

10.1063/1.1754224 ◽

1965 ◽

Vol 6 (9) ◽

pp. 181-182 ◽

Author(s):

J. R. Szedon ◽

J. E. Sandor

Keyword(s):

Metal Oxide ◽

Electron Irradiation ◽

Metal Oxide Semiconductor ◽

Energy Electron ◽

Oxide Semiconductor ◽

Semiconductor Structures ◽

Low Energy Electron

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Resolution of calixarene resist under low energy electron irradiation

Microelectronic Engineering ◽

10.1016/s0167-9317(98)00074-4 ◽

1998 ◽

Vol 41-42 ◽

pp. 323-326 ◽

Author(s):

J. Fujita ◽

Y. Ohnishi ◽

S. Manako ◽

Y. Ochiai ◽

E. Nomura ◽

...

Keyword(s):

Electron Irradiation ◽

Energy Electron ◽

Low Energy Electron

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