Terahertz Spectroscopy: System and Sensitivity Considerations

2011 ◽  
Vol 1 (1) ◽  
pp. 321-331 ◽  
Author(s):  
Heinz-Wilhelm Hubers ◽  
Maurice F. Kimmitt ◽  
Norihisa Hiromoto ◽  
Erik Brundermann
PIERS Online ◽  
2010 ◽  
Vol 6 (4) ◽  
pp. 390-394 ◽  
Author(s):  
Tadao Nagatsuma ◽  
Akira Kaino ◽  
Shintaro Hisatake ◽  
Katsuhiro Ajito ◽  
Ho-Jin Song ◽  
...  

2011 ◽  
Vol 82 (5) ◽  
pp. 053102 ◽  
Author(s):  
Frank Ellrich ◽  
Tristan Weinland ◽  
Daniel Molter ◽  
Joachim Jonuscheit ◽  
René Beigang

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
M. Baillergeau ◽  
K. Maussang ◽  
T. Nirrengarten ◽  
J. Palomo ◽  
L. H. Li ◽  
...  

Abstract Diffraction is the ultimate limit at which details of objects can be resolved in conventional optical spectroscopy and imaging systems. In the THz spectral range, spectroscopy systems increasingly rely on ultra-broadband radiation (extending over more 5 octaves) making a great challenge to reach resolution limited by diffraction. Here, we propose an original easy-to-implement wavefront manipulation concept to achieve ultrabroadband THz spectroscopy system with diffraction-limited resolution. Applying this concept to a large-area photoconductive emitter, we demonstrate diffraction-limited ultra-broadband spectroscopy system up to 14.5 THz with a dynamic range of 103. The strong focusing of ultrabroadband THz radiation provided by our approach is essential for investigating single micrometer-scale objects such as graphene flakes or living cells and besides for achieving intense ultra-broadband THz electric fields.


1994 ◽  
Author(s):  
J. S. Bostak ◽  
David M. Bloom ◽  
Daniel W. van der Weide ◽  
B. A. Auld ◽  
Ekmel Ozbay

Author(s):  
Jeffrey S. Bostak ◽  
Daniel W. Van Der Weide ◽  
Ikuro Aoki ◽  
Bertram A. Auld ◽  
David M. Bloom

2011 ◽  
Vol 20 (03) ◽  
pp. 629-638 ◽  
Author(s):  
LEI LIU ◽  
JEFFREY L. HESLER ◽  
ROBERT M. WEIKLE ◽  
TAO WANG ◽  
PATRICK FAY ◽  
...  

We report a room temperature 570-630 GHz frequency domain terahertz (THz) spectroscopy system developed on the basis of a broadband quasi-optical zero bias Schottky diode detector. The detector is designed to cover the frequency range of 100 GHz to nearly 900 GHz. A responsivity of 300-1000 V/W has been measured, and the noise equivalent power (NEP) is estimated to be 5-20 pW/√Hz based on the measurements of similar detectors. For a prototype demonstration, the frequency domain THz spectroscopy system was operated within the region of 570-630 GHz using a VDI (Virginia Diodes, Inc.) frequency extension module (FEM) to provide the THz radiation. Mylar thin films with different thicknesses and THz metal mesh filters have been measured using this system, demonstrating a measurement accuracy of ~2%. This system has been applied to measure biomolecules in liquid-phase, and nano-material samples in solid-phase. Initial results and discussion are presented.


2008 ◽  
Vol 75 (1) ◽  
Author(s):  
Frank Ellrich ◽  
Tristan Weinland ◽  
Michael Theuer ◽  
Joachim Jonuscheit ◽  
René Beigang

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