A new test pattern generation method for delay fault testing

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510871 ◽

2002 ◽

Author(s):

S. Cremoux ◽

C. Fagot ◽

P. Girard ◽

C. Landrault ◽

S. Pravossoudovitch

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing

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Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 IEEE 29th Asian Test Symposium (ATS) ◽

10.1109/ats49688.2020.9301568 ◽

2020 ◽

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Test Pattern ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

3D Ics ◽

Scan Test ◽

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LOC, LOS AND LOES AT-SPEED TESTING METHODOLOGIES FOR AUTOMATIC TEST PATTERN GENERATION USING TRANSITION DELAY FAULT MODEL

International Journal of Research in Engineering and Technology ◽

10.15623/ijret.2014.0303051 ◽

2014 ◽

Vol 03 (03) ◽

pp. 273-277 ◽

Author(s):

Parth Borda .

Keyword(s):

Test Pattern ◽

Fault Model ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Delay Fault ◽

Transition Delay

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Deterministic Delay Fault BIST Using Adjacency Test Pattern Generation

IEICE Transactions on Information and Systems ◽

10.1093/ietisy/e88-d.9.2135 ◽

2005 ◽

Vol E88-D (9) ◽

pp. 2135-2142 ◽

Author(s):

K. NAMBA

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

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A Minimized Test Pattern Generation Method for Ground Bounce Effect and Delay Fault Detection

Computational Science and Its Applications - ICCSA 2006 - Lecture Notes in Computer Science ◽

10.1007/11751632_63 ◽

2006 ◽

pp. 577-583 ◽

Author(s):

MoonJoon Kim ◽

JeongMin Lee ◽

WonGi Hong ◽

Hoon Chang

Keyword(s):

Fault Detection ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Fault ◽

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Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design

2007 44th ACM/IEEE Design Automation Conference ◽

10.1109/dac.2007.375222 ◽

2007 ◽

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor ◽

Vinay Jayaram

Keyword(s):

Test Pattern ◽

Supply Voltage ◽

Pattern Generation ◽

Test Pattern Generation ◽

Voltage Noise ◽

Delay Fault ◽

Transition Delay

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Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model

2020 IEEE European Test Symposium (ETS) ◽

10.1109/ets48528.2020.9131591 ◽

2020 ◽

Author(s):

Ching-Yuan Chen ◽

Ching-Hong Cheng ◽

Jiun-Lang Huang ◽

Krishnendu Chakrabarty

Keyword(s):

Test Pattern ◽

Circuit Model ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Fault ◽

Transition Delay

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Compaction mechanism to reduce test pattern counts and segmented delay fault testing for path delay faults

10.17077/etd.llxnejgn ◽

2013 ◽

Author(s):

Sharada Jha

Keyword(s):

Test Pattern ◽

Delay Faults ◽

Fault Testing ◽

Path Delay Faults ◽

Delay Fault ◽

Delay Fault Testing

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A Novel IR-Drop Tolerant Transition Delay Fault Test Pattern Generation Procedure

Journal of Low Power Electronics ◽

10.1166/jolpe.2010.1065 ◽

2010 ◽

Vol 6 (1) ◽

pp. 150-159 ◽

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Delay Fault ◽

Ir Drop ◽

Transition Delay ◽

Generation Procedure

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Transition delay fault test pattern generation considering supply voltage noise in a SOC design

2007 44th ACM/IEEE Design Automation Conference ◽

10.1145/1278480.1278616 ◽

2007 ◽

Author(s):

Nisar Ahmed ◽

Mohammad Tehranipoor ◽

Vinay Jayaram

Keyword(s):

Test Pattern ◽

Supply Voltage ◽

Pattern Generation ◽

Test Pattern Generation ◽

Voltage Noise ◽

Delay Fault ◽

Transition Delay

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Test pattern generation for logic crosstalk faults in VLSI circuits

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1991.0034 ◽

1991 ◽

Vol 138 (2) ◽

pp. 179 ◽

Author(s):

A. Rubio ◽

J.A. Sainz ◽

K. Kinoshita

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Vlsi Circuits ◽

Test Pattern Generation

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