Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 IEEE 29th Asian Test Symposium (ATS) ◽

10.1109/ats49688.2020.9301568 ◽

2020 ◽

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Test Pattern ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

3D Ics ◽

Scan Test ◽

Supply Noise

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Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2021.3108787 ◽

2021 ◽

pp. 1-14

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Supply Noise

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Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing

IEICE Transactions on Electronics ◽

10.1587/transele.e99.c.1219 ◽

2016 ◽

Vol E99.C (10) ◽

pp. 1219-1225

Author(s):

Masahiro ISHIDA ◽

Toru NAKURA ◽

Takashi KUSAKA ◽

Satoshi KOMATSU ◽

Kunihiro ASADA

Keyword(s):

Power Supply ◽

Supply Voltage ◽

Voltage Control ◽

Fault Testing ◽

Power Supply Voltage ◽

Delay Fault ◽

Delay Fault Testing

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Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e99.a.2320 ◽

2016 ◽

Vol E99.A (12) ◽

pp. 2320-2327

Author(s):

Cheng-Yu HAN ◽

Yu-Ching LI ◽

Hao-Tien KAN ◽

James Chien-Mo LI

Keyword(s):

Power Supply ◽

Test Pattern ◽

Timing Analysis ◽

Power Supply Noise ◽

Supply Noise

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Transition delay fault testing of 3D ICs with IR-drop study

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231065 ◽

2012 ◽

Cited By ~ 4

Author(s):

Shreepad Panth ◽

Sung Kyu Lim

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Ir Drop ◽

3D Ics ◽

Transition Delay

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A new test pattern generation method for delay fault testing

Proceedings of 14th VLSI Test Symposium ◽

10.1109/vtest.1996.510871 ◽

2002 ◽

Cited By ~ 4

Author(s):

S. Cremoux ◽

C. Fagot ◽

P. Girard ◽

C. Landrault ◽

S. Pravossoudovitch

Keyword(s):

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing

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F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG

2011 Sixteenth IEEE European Test Symposium ◽

10.1109/ets.2011.61 ◽

2011 ◽

Cited By ~ 1

Author(s):

Marie Engelene J. Obien ◽

Satoshi Ohtake ◽

Hideo Fujiwara

Keyword(s):

Test Generation ◽

Generation Model ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Scan Test ◽

Full Scan

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Power-Supply Noise Analysis for Monolithic 3D ICs Using Electrical and Thermal Co-Simulation

2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) ◽

10.1109/icecs.2018.8617951 ◽

2018 ◽

Cited By ~ 1

Author(s):

Abhishek Koneru ◽

Aida Todri-Sanial ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Noise Analysis ◽

Power Supply Noise ◽

3D Ics ◽

Supply Noise

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Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems ◽

10.1109/tvlsi.2012.2197427 ◽

2013 ◽

Vol 21 (5) ◽

pp. 958-970 ◽

Cited By ~ 8

Author(s):

Aida Todri ◽

Alberto Bosio ◽

Luigi Dilillo ◽

Patrick Girard ◽

Arnaud Virazel

Keyword(s):

Power Supply ◽

Test Pattern ◽

Pattern Generation ◽

Test Pattern Generation ◽

Power Supply Noise ◽

Supply Noise ◽

Ground Bounce

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Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICs

2019 IEEE 37th VLSI Test Symposium (VTS) ◽

10.1109/vts.2019.8758650 ◽

2019 ◽

Cited By ~ 1

Author(s):

Abhishek Koneru ◽

Aida Todri-Sanial ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Power Delivery ◽

Power Supply Noise ◽

3D Ics ◽

Supply Noise

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Evolution of automatic semiconductor test equipment: automatic test pattern learning, classification, optimisation and generation for power supply noise

IEEE International Symposium on Virtual Environments, Human-Computer Interfaces and Measurement Systems, 2003. VECIMS '03. 2003 ◽

10.1109/vecims.2003.1227027 ◽

2003 ◽

Author(s):

E. Liau ◽

D. Schmitt-Landsiedel

Keyword(s):

Power Supply ◽

Test Pattern ◽

Test Equipment ◽

Pattern Learning ◽

Power Supply Noise ◽

Automatic Test ◽

Semiconductor Test ◽

Supply Noise

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