2020 IEEE 29th Asian Test Symposium (ATS)
Latest Publications

TOTAL DOCUMENTS

60
(FIVE YEARS 0)

H-INDEX

0
(FIVE YEARS 0)

Published By IEEE

9781728174679
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Influence of Device Parameter Variability on Current Sharing of Parallel-Connected SiC MOSFETs

2020 ◽  
Author(s):  
Yohei Nakamura ◽  
Naotaka Kuroda ◽  
Atsushi Yamaguchi ◽  
Ken Nakahara ◽  
Michihiro Shintani ◽  
...  
Keyword(s):  
Current Sharing ◽  
Device Parameter

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers

2020 ◽  
Author(s):  
Gaku Ogihara ◽  
Takayuki Nakatani ◽  
Akemi Hatta ◽  
Keno Sato ◽  
Takashi Ishida ◽  
...  
Keyword(s):  
Test Method ◽  
Operational Amplifiers

Optimization Space Exploration of Hardware Design for CRYSTALS-KYBER

2020 ◽  
Author(s):  
Yixuan Zhao ◽  
Zhiteng Chao ◽  
Jing Ye ◽  
Wen Wang ◽  
Yuan Cao ◽  
...  
Keyword(s):  
Space Exploration ◽  
Hardware Design

Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 ◽  
Author(s):  
Shao-Chun Hung ◽  
Yi-Chen Lu ◽  
Sung Kyu Lim ◽  
Krishnendu Chakrabarty
Keyword(s):  
Power Supply ◽  
Test Pattern ◽  
Power Supply Noise ◽  
Fault Testing ◽  
Delay Fault ◽  
Delay Fault Testing ◽  
3D Ics ◽  
Scan Test ◽  
Supply Noise

HRAE: Hardware-assisted Randomization against Adversarial Example Attacks

2020 ◽  
Author(s):  
Jiliang Zhang ◽  
Shuang Peng ◽  
Yupeng Hu ◽  
Fei Peng ◽  
Wei Hu ◽  
...  
Keyword(s):  
Adversarial Example

BTI Aging Monitoring based on SRAM Start-up Behavior

2020 ◽  
Author(s):  
Shengyu Duan ◽  
Peng Wang ◽  
Gaole Sai
Keyword(s):  
Start Up

Pre-silicon Noise to Timing Test Methodology

2020 ◽  
Author(s):  
Fern Nee Tan ◽  
Jia Yun Chuah
Keyword(s):  
Test Methodology
Load More ...
Sign in / Sign up

Export Citation Format

Share Document