2020 IEEE 29th Asian Test Symposium (ATS)
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60
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9781728174679
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Influence of Device Parameter Variability on Current Sharing of Parallel-Connected SiC MOSFETs

2020 ◽  
Author(s):  
Yohei Nakamura ◽  
Naotaka Kuroda ◽  
Atsushi Yamaguchi ◽  
Ken Nakahara ◽  
Michihiro Shintani ◽  
...  
Keyword(s):  
Current Sharing ◽  
Device Parameter

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers

2020 ◽  
Author(s):  
Gaku Ogihara ◽  
Takayuki Nakatani ◽  
Akemi Hatta ◽  
Keno Sato ◽  
Takashi Ishida ◽  
...  
Keyword(s):  
Test Method ◽  
Operational Amplifiers

Optimization Space Exploration of Hardware Design for CRYSTALS-KYBER

2020 ◽  
Author(s):  
Yixuan Zhao ◽  
Zhiteng Chao ◽  
Jing Ye ◽  
Wen Wang ◽  
Yuan Cao ◽  
...  
Keyword(s):  
Space Exploration ◽  
Hardware Design

HRAE: Hardware-assisted Randomization against Adversarial Example Attacks

2020 ◽  
Author(s):  
Jiliang Zhang ◽  
Shuang Peng ◽  
Yupeng Hu ◽  
Fei Peng ◽  
Wei Hu ◽  
...  
Keyword(s):  
Adversarial Example
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