Dynamic gate leakage current of p-GaN Gate AlGaN/GaN HEMT under positive bias Conditions
2005 ◽
Vol 52
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pp. 159-164
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2016 ◽
Vol 63
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pp. 52-55
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2012 ◽
Vol 28
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pp. 015026
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2003 ◽
Vol 24
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pp. 500-502
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2014 ◽
Vol 65
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pp. 421-424
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