Dynamic gate leakage current of p-GaN Gate AlGaN/GaN HEMT under positive bias Conditions

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Yu Sun ◽  
Maojun Wang ◽  
Wen Lei ◽  
Chun Han
2008 ◽  
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2005 ◽  
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Vol 63 ◽  
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K. Kakushima

2012 ◽  
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V R Balakrishnan ◽  
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R Muralidharan

2017 ◽  
Vol 76-77 ◽  
pp. 350-356 ◽  
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2003 ◽  
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Anushree Tomar ◽  
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2014 ◽  
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pp. 421-424 ◽  
Author(s):  
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J. H. Lim ◽  
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W. Stanchina

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