Ultra-Trace Element Analysis of NIST SRM 616 and 614 using Laser Ablation Microprobe-Inductively Coupled Plasma-Mass Spectrometry (LAM-ICP-MS): a Comparison with Secondary Ion Mass Spectrometry (SIMS)
1997 ◽
Vol 21
(2)
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pp. 191-203
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2020 ◽
Vol 35
(8)
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pp. 1552-1557
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1997 ◽
Vol 141
(1-2)
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pp. 49-65
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2000 ◽
Vol 15
(9)
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pp. 1211-1216
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1997 ◽
Vol 61
(13)
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pp. 2559-2567
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2002 ◽
Vol 26
(1)
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pp. 75-84
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2008 ◽
Vol 273
(3)
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pp. 151-155
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