Effect of reference region size on strain measurements using geometrical phase analysis

2020 ◽  
Vol 278 (1) ◽  
pp. 49-56
Author(s):  
Y. WANG ◽  
X. GE ◽  
W. ZHANG
Keyword(s):  
Phase Analysis ◽  
Reference Region ◽  
Strain Measurements ◽  
Geometrical Phase ◽  
Region Size

Local Strain Measurement by Geometrical Phase Analysis in the Transmission Electron Microscope Applied to Strain-Engineered CMOS Devices

2008 ◽  
Vol 14 (S2) ◽  
pp. 388-389
Author(s):  
J Chung ◽  
G Lian ◽  
C Vartuli ◽  
S Rajagopalan ◽  
L Rabenberg
Keyword(s):  
Electron Microscope ◽  
New Mexico ◽  
Phase Analysis ◽  
Transmission Electron Microscope ◽  
Strain Measurement ◽  
Local Strain ◽  
Geometrical Phase ◽  
Transmission Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Mapping the strain distribution within embedded nanoparticles via geometrical phase analysis

Micron ◽  
2019 ◽  
Vol 125 ◽  
pp. 102715 ◽  
Author(s):  
Yan Wang ◽  
Wei Zhang
Keyword(s):  
Phase Analysis ◽  
Strain Distribution ◽  
Geometrical Phase ◽  
Embedded Nanoparticles
Sign in / Sign up

Export Citation Format

Share Document