Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007
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105

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Published By Springer Netherlands

9781402086144, 9781402086151

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Organic-Based Micropillar Structure Fabrication by Advanced Focused Ion Beam Milling Techniques

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_96 ◽

2008 ◽

pp. 449-452

Author(s):

Wen-Chang Hung ◽

Ali M Adawi ◽

Ashley Cadby ◽

Liam G Connolly ◽

Richard Deanl ◽

...

Keyword(s):

Focused Ion Beam ◽

Ion Beam ◽

Focused Ion Beam Milling

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Residual Strain Variations in MBE-Grown InN Thin Films

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_9 ◽

2008 ◽

pp. 41-44

Author(s):

A Delimitis ◽

Ph Komninou ◽

J Arvanitidis ◽

M Katsikini ◽

S-L Sahonta ◽

...

Keyword(s):

Residual Strain

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Quantitative Dopant Profiling in the SEM Including Surface States

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_88 ◽

2008 ◽

pp. 407-410

Author(s):

K W A Chee ◽

C Rodenburg ◽

C J Humphreys

Keyword(s):

Surface States ◽

Dopant Profiling

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Dopant Profiling of Silicon Calibration Specimens by Off-Axis Electron Holography

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_86 ◽

2008 ◽

pp. 399-402

Author(s):

D Cooper ◽

R Truche ◽

F Laugier ◽

F Bertin ◽

A Chabli

Keyword(s):

Electron Holography ◽

Dopant Profiling ◽

Silicon Calibration

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TEM Study of Ytterbium Silicide Thin Films

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_73 ◽

2008 ◽

pp. 333-336 ◽

Author(s):

J Deneen Nowak ◽

S H Song ◽

S A Campbell ◽

C B Carter

Keyword(s):

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Elemental Profiling of III-V MOSFET High-kDielectric Gate Stacks Using EELS Spectrum Imaging

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_69 ◽

2008 ◽

pp. 317-320 ◽

Author(s):

P Longo ◽

A J Craven ◽

J Scott ◽

M Holland ◽

I Thayne

Keyword(s):

Gate Stacks ◽

Spectrum Imaging ◽

Elemental Profiling

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Electron Energy-Loss Spectrum Imaging of an HfSiO High-k Dielectric Stack with a TaN Metal Gate

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_68 ◽

2008 ◽

pp. 313-316

Author(s):

M MacKenzie ◽

A J Craven ◽

D W McComb ◽

C M McGilvery ◽

S McFadzean ◽

...

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Electron Energy Loss Spectrum ◽

High K ◽

Spectrum Imaging ◽

High K Dielectric ◽

Electron Energy Loss

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Epitaxial (001) Ge on Crystalline Oxide Grown on (001) Si

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_27 ◽

2008 ◽

pp. 119-122

Author(s):

Ch Dieker ◽

J W Seo ◽

A Guiller ◽

M Sousa ◽

J-P Locquet ◽

...

Keyword(s):

Crystalline Oxide

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The Effect of Silane Treatment of AlxGa1−xN Surfaces

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_16 ◽

2008 ◽

pp. 69-72

Author(s):

N Ketteniss ◽

M J Kappers ◽

C McAleese ◽

R A Oliver

Keyword(s):

Silane Treatment

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Interaction of Stacking Faults in Wurtzite a-Plane GaN on r-Plane Sapphire

Springer Proceedings in Physics - Microscopy of Semiconducting Materials 2007 ◽

10.1007/978-1-4020-8615-1_11 ◽

2008 ◽

pp. 49-52 ◽

Author(s):

R Kröger ◽

T Paskova ◽

A Rosenauer

Keyword(s):

Stacking Faults

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