Theory and Algorithms for Weighted Total Least-Squares Fitting of Lines, Planes, and Parallel Planes to Support Tolerancing Standards

Author(s):  
Craig M. Shakarji ◽  
Vijay Srinivasan

We present the theory and algorithms for fitting a line, a plane, two parallel planes (corresponding to a slot or a slab), or many parallel planes in a total (orthogonal) least-squares sense to coordinate data that is weighted. Each of these problems is reduced to a simple 3 × 3 matrix eigenvalue/eigenvector problem or an equivalent singular value decomposition problem, which can be solved using reliable and readily available commercial software. These methods were numerically verified by comparing them with brute-force minimization searches. We demonstrate the need for such weighted total least-squares fitting in coordinate metrology to support new and emerging tolerancing standards, for instance, ISO 14405-1:2010. The widespread practice of unweighted fitting works well enough when point sampling is controlled and can be made uniform (e.g., using a discrete point contact coordinate measuring machine). However, we show by example that nonuniformly sampled points (arising from many new measurement technologies) coupled with unweighted least-squares fitting can lead to erroneous results. When needed, the algorithms presented also solve the unweighted cases simply by assigning the value one to each weight. We additionally prove convergence from the discrete to continuous cases of least-squares fitting as the point sampling becomes dense.

Author(s):  
Craig M. Shakarji ◽  
Vijay Srinivasan

We present elegant algorithms for fitting a plane, two parallel planes (corresponding to a slot or a slab) or many parallel planes in a total (orthogonal) least-squares sense to coordinate data that is weighted. Each of these problems is reduced to a simple 3×3 matrix eigenvalue/eigenvector problem or an equivalent singular value decomposition problem, which can be solved using reliable and readily available commercial software. These methods were numerically verified by comparing them with brute-force minimization searches. We demonstrate the need for such weighted total least-squares fitting in coordinate metrology to support new and emerging tolerancing standards, for instance, ISO 14405-1:2010. The widespread practice of unweighted fitting works well enough when point sampling is controlled and can be made uniform (e.g., using a discrete point contact Coordinate Measuring Machine). However, we demonstrate that nonuniformly sampled points (arising from many new measurement technologies) coupled with unweighted least-squares fitting can lead to erroneous results. When needed, the algorithms presented also solve the unweighted cases simply by assigning the value one to each weight. We additionally prove convergence from the discrete to continuous cases of least-squares fitting as the point sampling becomes dense.


Author(s):  
Craig M. Shakarji ◽  
Vijay Srinivasan

We present the theory and algorithms for establishing a datum plane consistent with ASME Y14.5 standard definitions. Such a datum plane will correspond to a planar datum feature sampled with coordinate data that is weighted. The method uses a one-sided minimization search based on the L1 (L1) norm. We prove that the problem reduces to a simple minimization search between the weighted centroid and the convex hull. The practice of unweighted fitting works well enough when point sampling is controlled and can thus be made uniform (e.g., using a discrete point contact Coordinate Measuring Machine). However, we show by example that nonuniformly sampled points (arising from many new measurement technologies) coupled with unweighted fitting can lead to erroneous results. When needed, the algorithms presented also solve the unweighted cases simply by assigning the value one to each weight. Terse Mathematica code is included for the reader. The code is sufficient for constrained and unconstrained planar fitting as well as a 3-2-1 datum reference frame generation, which is also described in detail. We additionally prove convergence from the discrete to continuous cases of datum establishment as the point sampling becomes dense.


Author(s):  
Vijay Srinivasan ◽  
Craig M. Shakarji ◽  
Edward P. Morse

The vast majority of points collected with coordinate measuring machines are not used in isolation; rather, collections of these points are associated with geometric features through fitting routines. In manufacturing applications, there are two fundamental questions that persist about the efficacy of this fitting—first, do the points collected adequately represent the surface under inspection; and second, does the association of substitute (fitted) geometry with the points meet criteria consistent with the standardized geometric specification of the product. This paper addresses the second question for least-squares fitting both as a historical survey of past and current practices, and as a harbinger of the influence of new specification criteria under consideration for international standardization. It also touches upon a set of new issues posed by the international standardization on the first question as related to sampling and least-squares fitting.


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