Characterization of Roll-Cladded Aluminum Plates With Laser-Based Surface-Acoustic-Wave Measurements

2021 ◽  
Author(s):  
Clemens Grünsteidl ◽  
Georg Watzl ◽  
Christian Kerschbaummayr ◽  
Edgar Scherleitner ◽  
Günther Mayr ◽  
...  
Keyword(s):  
Optimization Procedure ◽  
Guided Wave ◽  
Laser Ultrasound ◽  
Ultrasound Technique ◽  
Wave Measurements ◽  
Dispersion Data ◽  
Free Parameters ◽  
Aluminum Plates ◽  
Non Destructive

Abstract We investigated roll-cladded aluminum structures consisting of a layer of Al4045 on Al3003 with a non-destructive laser-ultrasound technique. We determined the thickness of the cladding layer based on the dispersion of the fundamental guided wave propagating along the surface. We analyzed eight surfaces, with cladding thicknesses ranging from 0 to approximately 400μm The inversion of the dispersion data to obtain the thickness yielded in consistent results, which we compare to reference values obtained from micrographs. For the optimization procedure we allowed the material properties to be free parameters, but constrained them to be equal for all samples.

Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method

1988 ◽  
Vol 32 ◽  
pp. 293-301
Author(s):  
G. Kimmel ◽  
G. Shafirstein ◽  
M. Bamberger
Keyword(s):  
Continuous Wave ◽  
Thickness Measurement ◽  
Amorphous Coating ◽  
X Ray Diffraction ◽  
Crystalline Layer ◽  
Optimization Study ◽  
Aluminum Plates ◽  
Non Destructive ◽  
Layer Coating

In this work a continuous wave CO2 laser was used for melting a layer of amorphous alumina obtained by anodizing 6061 aluminum plates. Melting the surface of the anodized plates led to the formation of a new uniform corundum layer at the expense of some of the amorphous coating, resulting in a double layer coating of crysta11ine on amorphous.The characterization of the corundum layer is essential for process optimization study. Among the non-destructive methods X-ray diffraction is useful, because it provides us with selected data on the crystalline layer.

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