Investigating Pb diffusion across buried interfaces in Pb(Zr0.2
Ti0.8
)O3
 thin films via time-of-flight secondary ion mass spectrometry depth profiling

Time Of Flight ◽

Depth Profiling ◽

Buried Interfaces ◽

Ion Mass Spectrometry ◽

Evaluation of sputtering induced surface roughness development of Ni/Cu multilayers thin films by Time-of-Flight Secondary Ion Mass Spectrometry depth profiling with different energies O2+ ion bombardment

Thin Solid Films ◽

10.1016/j.tsf.2018.10.049 ◽

2019 ◽

Vol 669 ◽

pp. 188-197

Author(s):

X.L. Yan ◽

M.M. Duvenhage ◽

J.Y. Wang ◽

H.C. Swart ◽

J.J. Terblans

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Surface Roughness ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Bombardment ◽

Ion Mass Spectrometry ◽

Are cluster ion analysis beams good choices for hydrogen depth profiling using time-of-flight secondary ion mass spectrometry?

Surface and Interface Analysis ◽

10.1002/sia.3776 ◽

2011 ◽

Vol 44 (1) ◽

pp. 89-93 ◽

Cited By ~ 10

Author(s):

Zihua Zhu ◽

Vaithiyalingam Shutthanandan

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Mass Spectrometry ◽

Cluster Ion ◽

Secondary Ion ◽

Ion Analysis

Three dimensional analysis of self-structuring organic thin films using time-of-flight secondary ion mass spectrometry

Thin Solid Films ◽

10.1016/j.tsf.2011.04.018 ◽

2011 ◽

Vol 519 (18) ◽

pp. 6183-6189 ◽

Cited By ~ 4

Author(s):

Karl E. Mayerhofer ◽

Jakob Heier ◽

Ylenia Maniglio ◽

Beat Andreas Keller

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Dimensional Analysis ◽

Three Dimensional ◽

Time Of Flight ◽

Organic Thin Films ◽

Ion Mass Spectrometry ◽

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Time-of-flight secondary ion mass spectrometry depth profiling of multiple quantum well II–VI semiconductors using negative cluster ions

10.1116/1.590543 ◽

1999 ◽

Vol 17 (1) ◽

pp. 224 ◽

Cited By ~ 2

Author(s):

Jin Zhao ◽

Myunghee Na ◽

Patrick J. McKeown ◽

Huicheng Chang ◽

Eunhwa Lee ◽

...

Keyword(s):

Mass Spectrometry ◽

Quantum Well ◽

Multiple Quantum Well ◽

Time Of Flight ◽

Depth Profiling ◽

Cluster Ions ◽

Multiple Quantum ◽

Ion Mass Spectrometry ◽

Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

Angewandte Chemie International Edition in English ◽

10.1002/anie.199410231 ◽

1994 ◽

Vol 33 (10) ◽

pp. 1023-1043 ◽

Cited By ~ 329

Author(s):

Alfred Benninghoven

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Chemical Analysis ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Organic Surfaces ◽

Secondary Ion ◽

Inorganic And Organic

Nanoconfinement of Ionic Liquid and Polymers in Supported Thin Films: A Time-of-Flight Secondary Ion Mass Spectrometry Study of Surface Diffusion

The Journal of Physical Chemistry C ◽

10.1021/jp404816t ◽

2013 ◽

Vol 117 (41) ◽

pp. 21281-21287 ◽

Cited By ~ 2

Author(s):

Ryutaro Souda

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Ionic Liquid ◽

Surface Diffusion ◽

Time Of Flight ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Quantitative depth profiling of Si1–xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry

Thin Solid Films ◽

10.1016/j.tsf.2016.03.049 ◽

2016 ◽

Vol 607 ◽

pp. 25-31 ◽

Cited By ~ 3

Author(s):

M.N. Drozdov ◽

Y.N. Drozdov ◽

A. Csik ◽

A.V. Novikov ◽

K. Vad ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Ion Mass Spectrometry ◽

Application of multivariate statistical analysis methods for improved time-of-flight secondary ion mass spectrometry depth profiling of buried interfaces and particulate

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.2735950 ◽

2007 ◽

Vol 25 (4) ◽

pp. 878-885 ◽

Cited By ~ 8

Author(s):

K. G. Lloyd

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Multivariate Statistical Analysis ◽

Time Of Flight ◽

Depth Profiling ◽

Multivariate Statistical ◽

Buried Interfaces ◽

Secondary Ion ◽

Statistical Analysis Methods

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Ultra-shallow depth profiling with time-of-flight secondary ion mass spectrometry

10.1116/1.587143 ◽

1994 ◽

Vol 12 (1) ◽

pp. 214 ◽

Cited By ~ 5

Author(s):

J. Bennett

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Depth Profiling ◽

Shallow Depth ◽

Ion Mass Spectrometry ◽

Depth Profiling of Poly(l-lactic acid)/Triblock Copolymer Blends with Time-of-Flight Secondary Ion Mass Spectrometry

Analytical Chemistry ◽

10.1021/ac048274i ◽

2005 ◽

Vol 77 (11) ◽

pp. 3570-3578 ◽

Cited By ~ 40

Author(s):

Christine M. Mahoney ◽

Jinxiang Yu ◽

Joseph A. Gardella

Keyword(s):

Mass Spectrometry ◽

Lactic Acid ◽

Triblock Copolymer ◽

Time Of Flight ◽

Depth Profiling ◽

Copolymer Blends ◽

Ion Mass Spectrometry ◽