Superposition of Auger electron spectroscopy depth profiles obtained on Cr/Ni multilayer samples with different roughnesses

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574642 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1209-1212 ◽

Author(s):

A. Zalar ◽

S. Hofmann

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiles ◽

Auger Electron Spectroscopy Depth

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Determination of the depth resolution of Auger electron spectroscopy depth profiles of anodic barrier oxide films on differently pretreated aluminium substrates

Surface and Interface Analysis ◽

10.1002/sia.740220139 ◽

1994 ◽

Vol 22 (1-12) ◽

pp. 175-180 ◽

Author(s):

J. De Laet ◽

K. De Boeck ◽

H. Terryn ◽

J. Vereecken

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Oxide Films ◽

Depth Resolution ◽

Depth Profiles ◽

Auger Electron Spectroscopy Depth

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A comparison of X-ray photoelectron spectroscopy and Auger electron spectroscopy depth profiles for magnesium implants

Applied Surface Science ◽

10.1016/0169-4332(94)00362-9 ◽

1995 ◽

Vol 84 (1) ◽

pp. 23-29 ◽

Author(s):

J.A. Schreifels ◽

N.H. Turner ◽

R.E. Morris

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Depth Profiles ◽

Auger Electron Spectroscopy Depth

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Application of linear least squares to the analysis of Auger electron spectroscopy depth profiles of plutonium oxides

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.5021587 ◽

2018 ◽

Vol 36 (3) ◽

pp. 03E104 ◽

Author(s):

Scott B. Donald ◽

Jeff A. Stanford ◽

William McLean ◽

Art J. Nelson

Keyword(s):

Auger Electron Spectroscopy ◽

Least Squares ◽

Electron Spectroscopy ◽

Auger Electron ◽

Linear Least Squares ◽

Depth Profiles ◽

Auger Electron Spectroscopy Depth

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Factors affecting depth resolution and chemistry in Auger electron spectroscopy depth profiles of Mos and MNOS structures

Thin Solid Films ◽

10.1016/0040-6090(78)90368-1 ◽

1978 ◽

Vol 53 (1) ◽

pp. 37

Author(s):

Y.E. Strausser ◽

C.R. Helms ◽

S. Schwarz ◽

W.E. Spicer

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Resolution ◽

Factors Affecting ◽

Depth Profiles ◽

Auger Electron Spectroscopy Depth

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Oxide-state evaluation of the zinc and aluminium in metallic thin films using Auger-electron-spectroscopy depth profiles

Vacuum ◽

10.1016/j.vacuum.2012.09.019 ◽

2013 ◽

Vol 98 ◽

pp. 88-92 ◽

Author(s):

Djordje Mandrino ◽

Matjaž Godec ◽

David Nolan

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Metallic Thin Films ◽

Depth Profiles ◽

State Evaluation ◽

Auger Electron Spectroscopy Depth

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Oxide state evaluation of magnesium and calcium in thin metallic film using Auger electron spectroscopy depth profiles

Corrosion Engineering Science and Technology ◽

10.1179/1743278215y.0000000025 ◽

2015 ◽

Vol 50 (8) ◽

pp. 601-605

Author(s):

D. Mandrino ◽

D. Nolan

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Metallic Film ◽

Thin Metallic Film ◽

Depth Profiles ◽

State Evaluation ◽

Auger Electron Spectroscopy Depth

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Analysis of Auger electron spectroscopy depth profiles of the copper/silver interface of mirrors

Solar Energy Materials ◽

10.1016/0165-1633(83)90029-1 ◽

1983 ◽

Vol 9 (1) ◽

pp. 43-50

Author(s):

Linda S. Dake ◽

John S. Hartman

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Depth Profiles ◽

Auger Electron Spectroscopy Depth

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Ion scattering spectroscopy and Auger electron spectroscopy depth profiles of silver–copper thin film interdiffusion

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.573991 ◽

1986 ◽

Vol 4 (3) ◽

pp. 1671-1674 ◽

Author(s):

J. R. Pitts ◽

A. W. Czanderna ◽

T. M. Thomas

Keyword(s):

Thin Film ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Scattering ◽

Copper Thin Film ◽

Depth Profiles ◽

Silver Copper ◽

Ion Scattering Spectroscopy ◽

Auger Electron Spectroscopy Depth

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Evaluation of Auger Electron Spectroscopy (AES) depth-profiles by application of Factor Analysis

Fresenius Journal of Analytical Chemistry ◽

10.1007/bf00322110 ◽

1991 ◽

Vol 341 (1-2) ◽

pp. 70-73 ◽

Author(s):

E. Oesterschulze ◽

K. Ma�eli ◽

R. Kassing

Keyword(s):

Factor Analysis ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

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Quantitative comparison between Auger electron spectroscopy and secondary ion mass spectroscopy depth profiles of a double layer structure of AlAs in GaAs using the mixing-roughness-information depth model

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.1345899 ◽

2001 ◽

Vol 19 (4) ◽

pp. 1111-1115 ◽

Author(s):

S. Hofmann ◽

A. Rar ◽

D. W. Moon ◽

K. Yoshihara

Keyword(s):

Auger Electron Spectroscopy ◽

Mass Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Layer Structure ◽

Quantitative Comparison ◽

Depth Profiles ◽

Double Layer Structure ◽

Information Depth ◽

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