Reflection high‐energy electron diffraction intensity oscillations and surface reconstructions measured during epitaxial growth of Si(001) from Si2H6 molecular beams
1992 ◽
Vol 10
(4)
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pp. 1846-1855
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1997 ◽
Vol 15
(3)
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pp. 911-914
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Keyword(s):
2000 ◽
Vol 458
(1-3)
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pp. 247-256
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2010 ◽
Vol 31
(11)
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pp. 113001
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