Reflection high‐energy electron diffraction intensity oscillations and surface reconstructions measured during epitaxial growth of Si(001) from Si2H6 molecular beams

1992 ◽  
Vol 10 (4) ◽  
pp. 1846-1855 ◽  
Author(s):  
S. M. Mokler ◽  
W. K. Liu ◽  
N. Ohtani ◽  
B. A. Joyce
1992 ◽  
Vol 46 (11) ◽  
pp. 6815-6824 ◽  
Author(s):  
T. Shitara ◽  
D. D. Vvedensky ◽  
M. R. Wilby ◽  
J. Zhang ◽  
J. H. Neave ◽  
...  

1992 ◽  
Vol 60 (12) ◽  
pp. 1504-1506 ◽  
Author(s):  
T. Shitara ◽  
D. D. Vvedensky ◽  
M. R. Wilby ◽  
J. Zhang ◽  
J. H. Neave ◽  
...  

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