Comparison between ultraviolet-photoelectron spectroscopy and reflection high-energy electron diffraction intensity oscillations during Si epitaxial growth on Si(100)

1997 ◽  
Vol 15 (3) ◽  
pp. 911-914 ◽  
Author(s):  
Y. Enta ◽  
H. Irimachi ◽  
M. Suemitsu ◽  
N. Miyamoto
1992 ◽  
Vol 46 (11) ◽  
pp. 6815-6824 ◽  
Author(s):  
T. Shitara ◽  
D. D. Vvedensky ◽  
M. R. Wilby ◽  
J. Zhang ◽  
J. H. Neave ◽  
...  

1992 ◽  
Vol 60 (12) ◽  
pp. 1504-1506 ◽  
Author(s):  
T. Shitara ◽  
D. D. Vvedensky ◽  
M. R. Wilby ◽  
J. Zhang ◽  
J. H. Neave ◽  
...  

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