Comparison between ultraviolet-photoelectron spectroscopy and reflection high-energy electron diffraction intensity oscillations during Si epitaxial growth on Si(100)
1997 ◽
Vol 15
(3)
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pp. 911-914
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1992 ◽
Vol 10
(4)
◽
pp. 1846-1855
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2007 ◽
Vol 24
(7)
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pp. 2022-2024
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Keyword(s):
Keyword(s):
2000 ◽
Vol 458
(1-3)
◽
pp. 247-256
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1990 ◽
Vol 65
(21)
◽
pp. 2684-2687
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