Static secondary ion mass spectrometry and x‐ray photoelectron spectroscopy for the characterization of surface defects in paper products
1994 ◽
Vol 12
(4)
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pp. 2515-2522
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1992 ◽
Vol 3
(6)
◽
pp. 463-480
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2016 ◽
Vol 22
(S3)
◽
pp. 346-347
◽
1991 ◽
Vol 9
(3)
◽
pp. 1441-1446
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