Nondestructive test methodology for molecular beam epitaxy grown pseudomorphic high electron mobility transistor materials

Author(s):  
Y. C. Pao
2019 ◽  
Vol 58 (SC) ◽  
pp. SC1010 ◽  
Author(s):  
Ahmed Alyamani ◽  
Evgenii V. Lutsenko ◽  
Mikalai V. Rzheutski ◽  
Vitaly Z. Zubialevich ◽  
Aliaksei G. Vainilovich ◽  
...  

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