Oscillating contrast in room-temperature scanning tunneling microscope images of localized charges in III–V semiconductor cleavage surfaces
1998 ◽
Vol 16
(5)
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pp. 2825
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2019 ◽
Vol 90
(9)
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pp. 093702
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2007 ◽
Vol 50
(3)
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pp. 422-423
2009 ◽
Vol 150
(1)
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pp. 012007
1990 ◽
Vol 8
(1)
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pp. 327-329
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1996 ◽
Vol 46
(S5)
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pp. 2847-2848
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