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Annealing temperature dependence of random lasing properties in a diamond nanoparticle film
Mapping Intimacies
◽
10.1117/12.2078629
◽
2015
◽
Author(s):
Ryo Niyuki
◽
Hideaki Takashima
◽
Hideki Fujiwara
◽
Keiji Sasaki
Keyword(s):
Temperature Dependence
◽
Annealing Temperature
◽
Random Lasing
◽
Nanoparticle Film
◽
Annealing Temperature Dependence
◽
Diamond Nanoparticle
Download Full-text
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References
Annealing temperature dependence of the performance of bulk heterojunction polymer: Fullerene solar cells under short and open circuit conditions
Synthetic Metals
◽
10.1016/j.synthmet.2020.116611
◽
2021
◽
Vol 271
◽
pp. 116611
Author(s):
M. Radaoui
◽
A. Ben Fredj
◽
S. Romdhane
◽
D.A.M. Egbe
◽
H. Bouchriha
Keyword(s):
Solar Cells
◽
Temperature Dependence
◽
Annealing Temperature
◽
Bulk Heterojunction
◽
Open Circuit
◽
Annealing Temperature Dependence
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Current perpendicular-to-plane giant magnetoresistance using anL12Ag3Mgspacer andCo2Fe0.4Mn0.6SiHeusler alloy electrodes: Spacer thickness and annealing temperature dependence
Physical Review Materials
◽
10.1103/physrevmaterials.1.044402
◽
2017
◽
Vol 1
(4)
◽
Cited By ~ 10
Author(s):
Takahide Kubota
◽
Yusuke Ina
◽
Zhenchao Wen
◽
Hiroyuki Narisawa
◽
Koki Takanashi
Keyword(s):
Temperature Dependence
◽
Giant Magnetoresistance
◽
Annealing Temperature
◽
Current Perpendicular To Plane
◽
Spacer Thickness
◽
Annealing Temperature Dependence
Download Full-text
Thickness and annealing temperature dependence of perpendicular exchange biasing in [Pd/Co]/FeMn multilayers
INTERMAG Asia 2005. Digests of the IEEE International Magnetics Conference, 2005.
◽
10.1109/intmag.2005.1464463
◽
2005
◽
Author(s):
H.W. Joo
◽
S.W. Kim
◽
M.S. Lee
◽
J.H. An
◽
S.D. Choi
◽
...
Keyword(s):
Temperature Dependence
◽
Annealing Temperature
◽
Exchange Biasing
◽
Annealing Temperature Dependence
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Annealing temperature dependence of photoluminescent characteristics of silicon nanocrystals embedded in silicon-rich silicon nitride films grown by PECVD
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
◽
10.1016/j.nimb.2012.12.096
◽
2013
◽
Vol 307
◽
pp. 344-348
◽
Cited By ~ 4
Author(s):
D.S. Chao
◽
J.H. Liang
Keyword(s):
Silicon Nitride
◽
Temperature Dependence
◽
Silicon Nanocrystals
◽
Annealing Temperature
◽
Silicon Nitride Films
◽
Annealing Temperature Dependence
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The annealing temperature dependence of anatase TiO2thin films prepared by the electron-beam evaporation method
Semiconductor Science and Technology
◽
10.1088/0268-1242/31/12/125012
◽
2016
◽
Vol 31
(12)
◽
pp. 125012
◽
Cited By ~ 31
Author(s):
Atefeh Taherniya
◽
Davood Raoufi
Keyword(s):
Electron Beam
◽
Temperature Dependence
◽
Annealing Temperature
◽
Electron Beam Evaporation
◽
Evaporation Method
◽
Annealing Temperature Dependence
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Annealing Temperature Dependence of Photoluminescence from Silicon-Rich Silica Films
Plasma Science and Technology
◽
10.1088/1009-0630/3/4/009
◽
2001
◽
Vol 3
(4)
◽
pp. 891-895
Author(s):
Wu Xue-mei
◽
Zhuge Lan-jian
◽
Tang Nai-yun
◽
Ye Chun-nuan
◽
Ning Zao-yuan
◽
...
Keyword(s):
Temperature Dependence
◽
Annealing Temperature
◽
Silica Films
◽
Annealing Temperature Dependence
Download Full-text
Annealing-temperature Dependence of Compositional Depth Profile and Chemical Structures of LaOx/ScOx/Si and ScOx/LaOx/Si Interfacial Transition Layer
ECS Transactions
◽
10.1149/1.2981599
◽
2019
◽
Vol 16
(5)
◽
pp. 171-176
◽
Cited By ~ 1
Author(s):
Hiroshi Nohira
◽
Yoshinori Takenaga
◽
Kuniyuki Kakushima
◽
Parhat Ahmet
◽
Kazuo Tsutsui
◽
...
Keyword(s):
Temperature Dependence
◽
Depth Profile
◽
Transition Layer
◽
Annealing Temperature
◽
Chemical Structures
◽
Compositional Depth Profile
◽
Annealing Temperature Dependence
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Testing field and annealing temperature dependence of leakage properties in Bi3.25La0.75Ti3O12 thin films
Thin Solid Films
◽
10.1016/j.tsf.2010.11.021
◽
2011
◽
Vol 519
(7)
◽
pp. 2376-2380
◽
Cited By ~ 3
Author(s):
Xiumei Wu
◽
Shuai Dong
◽
Ya Zhai
◽
Mingxiang Xu
◽
Yi Kan
Keyword(s):
Thin Films
◽
Temperature Dependence
◽
Annealing Temperature
◽
Testing Field
◽
Annealing Temperature Dependence
Download Full-text
Ti-content and annealing temperature dependence of deformation characteristics of TiXNi(92−X)Cu8 shape memory alloys
Acta Materialia
◽
10.1016/s1359-6454(97)00479-5
◽
1998
◽
Vol 46
(8)
◽
pp. 2729-2740
◽
Cited By ~ 18
Author(s):
S.M. Tan
◽
V.H. No
◽
S. Miyazaki
Keyword(s):
Shape Memory Alloys
◽
Shape Memory
◽
Temperature Dependence
◽
Annealing Temperature
◽
Deformation Characteristics
◽
Ti Content
◽
Annealing Temperature Dependence
Download Full-text
Annealing Temperature Dependence of ZTO Thin Film Properties and Its Application on Thin Film Transistors by Inkjet Printing
Journal of Electronic Materials
◽
10.1007/s11664-019-07871-7
◽
2019
◽
Vol 49
(3)
◽
pp. 2003-2007
Author(s):
Sang Ouk Ryu
◽
Cheul Ho Ha
◽
Ho Young Jun
◽
Si Ok Ryu
Keyword(s):
Thin Film
◽
Temperature Dependence
◽
Inkjet Printing
◽
Thin Film Transistors
◽
Annealing Temperature
◽
Film Properties
◽
Annealing Temperature Dependence
Download Full-text
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