Optimum electrode configuration selection for electrical resistance change based damage detection in composites using an effective independence measure

2016 ◽  
Author(s):  
Luis Escalona ◽  
Paulina Díaz-Montiel ◽  
Satchi Venkataraman
Keyword(s):  
Damage Detection ◽  
Electrical Resistance ◽  
Electrode Configuration ◽  
Resistance Change ◽  
Configuration Selection ◽  
Selection For ◽  
Electrical Resistance Change

Statistical Damage Detection of Laminated CFRP Beam Using Electrical Resistance Change Method

2007 ◽  
Vol 353-358 ◽  
pp. 1330-1333 ◽  
Author(s):  
Kosuke Takahashi ◽  
Akira Todoroki ◽  
Yoshinobu Shimamura ◽  
Atsushi Iwasaki
Keyword(s):  
Damage Detection ◽  
Electrical Resistance ◽  
Damage Identification ◽  
Detection System ◽  
Measuring Method ◽  
Resistance Change ◽  
Delamination Crack ◽  
Electrical Resistance Change ◽  
Electrical Interference ◽  
Statistical Damage

Statistical diagnosis using electrical resistance changes is performed to detect a delamination crack in a CFRP beam. This method enables to reduce data required for damage identification. First, a new measuring method of multiple electrical resistance changes is proposed to perform statistical diagnosis. The proposed method measures electrical resistance changes of multiple segments in a CFRP beam although electrical interference must be considered when multiple voltages are charged at once. Next, statistical diagnosis is performed on loading to the CFRP beam. A delamination crack is detected by the change of relative relationship between multiple electrical resistance changes due to damage occurring. As a result, the monitored states of the CFRP beam are diagnosed exactly by the proposed damage detection system.

Statistical Damage Detection of Laminated CFRP Beam Using Electrical Resistance Change Method

2007 ◽  
Vol 353-358 ◽  
pp. 2337-2340 ◽  
Author(s):  
Kosuke Takahashi ◽  
Akira Todoroki ◽  
Yoshinobu Shimamura ◽  
Atsushi Iwasaki
Keyword(s):  
Damage Detection ◽  
Electrical Resistance ◽  
Damage Identification ◽  
Detection System ◽  
Measuring Method ◽  
Resistance Change ◽  
Delamination Crack ◽  
Electrical Resistance Change ◽  
Electrical Interference ◽  
Statistical Damage

Statistical diagnosis using electrical resistance changes is performed to detect a delamination crack in a CFRP beam. This method enables to reduce data required for damage identification. First, a new measuring method of multiple electrical resistance changes is proposed to perform statistical diagnosis. The proposed method measures electrical resistance changes of multiple segments in a CFRP beam although electrical interference must be considered when multiple voltages are charged at once. Next, statistical diagnosis is performed on loading to the CFRP beam. A delamination crack is detected by the change of relative relationship between multiple electrical resistance changes due to damage occurring. As a result, the monitored states of the CFRP beam are diagnosed exactly by the proposed damage detection system.

Electrical Failure and Damage Analysis of Multi-Layer Metal Films on Flexible Substrate during Cyclic Bending Deformation

2011 ◽  
Author(s):  
Byoung-Joon Kim ◽  
Hae-A-Seul Shin ◽  
In-Suk Choi ◽  
Young-Chang Joo
Keyword(s):  
Fatigue Resistance ◽  
Electrical Resistance ◽  
Metal Film ◽  
Flexible Substrate ◽  
Resistance Change ◽  
Cyclic Bending ◽  
Capping Layer ◽  
Bending Strain ◽  
Cu Film ◽  
Electrical Resistance Change

Abstract The electrical resistance Cu film on flexible substrate was investigated in cyclic bending deformation. The electrical resistance of 1 µm thick Cu film on flexible substrate increased up to 120 % after 500,000 cycles in 1.1 % tensile bending strain. Crack and extrusion were observed due to the fatigue damage of metal film. Low bending strain did not cause any damage on metal film but higher bending strain resulted in severe electrical and mechanical damage. Thinner film showed higher fatigue resistance because of the better mechanical property of thin film. Cu film with NiCr under-layer showed poorer fatigue resistance in tensile bending mode. Ni capping layer did not improve the fatigue resistance of Cu film, but Al capping layer suppressed crack formation and lowered electrical resistance change. The NiCr under layer, Ni capping layer, and Al capping layer effect on electrical resistance change of Cu film was compared with Cu only sample.

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