Automated centration measurement and quality inspection of aspheric lenses

Author(s):  
Felix Hahne ◽  
Patrik Langehanenberg
2015 ◽  
Author(s):  
Eric S. Richter ◽  
Arthur L. McClellan ◽  
Jack Harrington ◽  
Jeanne Kerr ◽  
Dan Gresham ◽  
...  

2021 ◽  
Vol 72 ◽  
pp. 102200
Author(s):  
Zvezdan Lončarević ◽  
Andrej Gams ◽  
Simon Reberšek ◽  
Bojan Nemec ◽  
Jure Škrabar ◽  
...  

Sensors ◽  
2021 ◽  
Vol 21 (15) ◽  
pp. 5039
Author(s):  
Tae-Hyun Kim ◽  
Hye-Rin Kim ◽  
Yeong-Jun Cho

In this study, we present a framework for product quality inspection based on deep learning techniques. First, we categorize several deep learning models that can be applied to product inspection systems. In addition, we explain the steps for building a deep-learning-based inspection system in detail. Second, we address connection schemes that efficiently link deep learning models to product inspection systems. Finally, we propose an effective method that can maintain and enhance a product inspection system according to improvement goals of the existing product inspection systems. The proposed system is observed to possess good system maintenance and stability owing to the proposed methods. All the proposed methods are integrated into a unified framework and we provide detailed explanations of each proposed method. In order to verify the effectiveness of the proposed system, we compare and analyze the performance of the methods in various test scenarios. We expect that our study will provide useful guidelines to readers who desire to implement deep-learning-based systems for product inspection.


Electronics ◽  
2021 ◽  
Vol 10 (13) ◽  
pp. 1511
Author(s):  
Taylor Simons ◽  
Dah-Jye Lee

There has been a recent surge in publications related to binarized neural networks (BNNs), which use binary values to represent both the weights and activations in deep neural networks (DNNs). Due to the bitwise nature of BNNs, there have been many efforts to implement BNNs on ASICs and FPGAs. While BNNs are excellent candidates for these kinds of resource-limited systems, most implementations still require very large FPGAs or CPU-FPGA co-processing systems. Our work focuses on reducing the computational cost of BNNs even further, making them more efficient to implement on FPGAs. We target embedded visual inspection tasks, like quality inspection sorting on manufactured parts and agricultural produce sorting. We propose a new binarized convolutional layer, called the neural jet features layer, that learns well-known classic computer vision kernels that are efficient to calculate as a group. We show that on visual inspection tasks, neural jet features perform comparably to standard BNN convolutional layers while using less computational resources. We also show that neural jet features tend to be more stable than BNN convolution layers when training small models.


Procedia CIRP ◽  
2021 ◽  
Vol 99 ◽  
pp. 496-501
Author(s):  
Ivan Vishev ◽  
Claus-Philipp Feuring ◽  
Oliver Bringmann

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