Combined ellipsometer, reflectometer, scatterometer, and Kerr effect microscope for thin film disk characterization
Keyword(s):
2003 ◽
Vol 42
(Part 2, No. 8A)
◽
pp. L914-L917
◽
Nanosecond pulsed field magnetization reversal in thin-film NiFe studied by Kerr effect magnetometry
2001 ◽
Vol 34
(20)
◽
pp. 3019-3023
◽
Keyword(s):
1988 ◽
Vol 24
(6)
◽
pp. 2838-2840
◽
1996 ◽
Vol 32
(5)
◽
pp. 4087-4089
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