Simulation and characterization of silicon oxynitrofluoride films as a phase-shift mask material for 157-nm optical lithography
Keyword(s):
2005 ◽
Vol 23
(2)
◽
pp. 417
◽
2014 ◽
Vol 113
◽
pp. 152-156
◽
Keyword(s):
1998 ◽
Vol 41-42
◽
pp. 61-64
◽
1998 ◽
Vol 37
(Part 1, No. 12B)
◽
pp. 6714-6717
◽