Capillary-discharge 46.9-nm laser-induced damage to a-C thin films exposed to multiple laser shots below single-shot damage threshold

2007 ◽  
Author(s):  
L. Juha ◽  
V. Hájková ◽  
J. Chalupsky ◽  
V. Vorliček ◽  
A. Ritucci ◽  
...  
Keyword(s):  
Thin Films ◽  
Damage Threshold ◽  
Capillary Discharge ◽  
Single Shot ◽  
Laser Induced Damage

Investigation of laser induced damage threshold measurement with single-shot on thin films

2016 ◽  
Vol 382 ◽  
pp. 294-301 ◽  
Author(s):  
Zhichao Liu ◽  
Yi Zheng ◽  
Feng Pan ◽  
Qi Lin ◽  
Ping Ma ◽  
...  
Keyword(s):  
Thin Films ◽  
Damage Threshold ◽  
Single Shot ◽  
Laser Induced Damage ◽  
Threshold Measurement

scholarly journals Laser-induced damage thresholds of ultrathin targets and their constraint on laser contrast in laser-driven ion acceleration experiments

2020 ◽  
Vol 8 ◽  
Author(s):  
Dahui Wang ◽  
Yinren Shou ◽  
Pengjie Wang ◽  
Jianbo Liu ◽  
Zhusong Mei ◽  
...  
Keyword(s):  
Damage Threshold ◽  
Wide Band ◽  
Laser Pulses ◽  
Laser Damage Threshold ◽  
Single Shot ◽  
Bulk Materials ◽  
Free Standing ◽  
Wide Band Gap ◽  
Different Types ◽  
Laser Induced Damage

Abstract Single-shot laser-induced damage threshold (LIDT) measurements of multi-type free-standing ultrathin foils were performed in a vacuum environment for 800 nm laser pulses with durations τ ranging from 50 fs to 200 ps. The results show that the laser damage threshold fluences (DTFs) of the ultrathin foils are significantly lower than those of corresponding bulk materials. Wide band gap dielectric targets such as SiN and formvar have larger DTFs than semiconductive and conductive targets by 1–3 orders of magnitude depending on the pulse duration. The damage mechanisms for different types of targets are studied. Based on the measurement, the constrain of the LIDTs on the laser contrast is discussed.

Optical, Structural and Laser-Induced Damage Threshold Properties of HfO 2 Thin Films Prepared by Electron Beam Evaporation

2005 ◽  
Vol 22 (5) ◽  
pp. 1246-1248 ◽  
Author(s):  
Zhan Mei-Qiong ◽  
Zhang Dong-Ping ◽  
Tan Tian-Ya ◽  
He Hong-Bo ◽  
Shao Jian-Da ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Damage Threshold ◽  
Electron Beam Evaporation ◽  
Laser Induced Damage

scholarly journals Radiation damage to amorphous carbon thin films irradiated by multiple 46.9 nm laser shots below the single-shot damage threshold

2009 ◽  
Vol 105 (9) ◽  
pp. 093117 ◽  
Author(s):  
L. Juha ◽  
V. Hájková ◽  
J. Chalupský ◽  
V. Vorlíček ◽  
A. Ritucci ◽  
...  
Keyword(s):  
Thin Films ◽  
Radiation Damage ◽  
Amorphous Carbon ◽  
Damage Threshold ◽  
Single Shot ◽  
Carbon Thin Films
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