Short Exposure Time Characteristics Of X-Ray Generators

1983 ◽  
Author(s):  
Bruce A. Horn ◽  
Kim C. Luk ◽  
David M. Thomasson ◽  
Charles E. Finney
Keyword(s):  
Exposure Time ◽  
Short Exposure ◽  
Short Exposure Time ◽  
X Ray

scholarly journals A SURVEY OF X-RAY GENERATOR'S DYNAMIC RESPONSE TO SHORT EXPOSURE TIME BY MEANS OF X-RAY STROBOSCOPE

1981 ◽  
Vol 37 (2) ◽  
pp. 148-155
Author(s):  
MOTOI FUJINO ◽  
KAZUTOSHI MATSUMOTO ◽  
MISAO ARAKI ◽  
KAZUHIKO SAITO ◽  
MIDORI YAMASHITA ◽  
...  
Keyword(s):  
Dynamic Response ◽  
Exposure Time ◽  
Short Exposure ◽  
Short Exposure Time ◽  
X Ray

scholarly journals 61. Questionnaire of diagnostic X-ray generator and exposure factors : The limit of short exposure time

1992 ◽  
Vol 48 (8) ◽  
pp. 1146
Author(s):  
I. MIYAZAKI ◽  
A. KATOUNO ◽  
T. OKUYAMA ◽  
K. TANABE ◽  
F. SHINOHARA ◽  
...  
Keyword(s):  
Exposure Time ◽  
Short Exposure ◽  
Short Exposure Time ◽  
X Ray

Speed Analysis of Laser Speckle Contrast with Ultra-Short Exposure Time

2018 ◽  
Vol 38 (4) ◽  
pp. 0411008
Author(s):  
安晓英 An Xiaoying ◽  
张茹 Zhang Ru ◽  
宋丽培 Song Lipei ◽  
武鹏飞 Wu Pengfei
Keyword(s):  
Exposure Time ◽  
Laser Speckle ◽  
Short Exposure ◽  
Short Exposure Time ◽  
Speckle Contrast

Short Exposure Time Sensitivity of White Cells to Shear Stress

ASAIO Journal ◽  
2003 ◽  
Vol 49 (6) ◽  
pp. 687-691 ◽  
Author(s):  
Janell Carter ◽  
Katia Hristova ◽  
Hiroaki Harasaki ◽  
W. A. Smith
Keyword(s):  
Shear Stress ◽  
Exposure Time ◽  
Short Exposure ◽  
Short Exposure Time ◽  
Time Sensitivity

X-Ray Analysis of Stress in a Localized Area by Use of Imaging Plate

1991 ◽  
Vol 35 (A) ◽  
pp. 537-543 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Shin'ichi Ohya
Keyword(s):  
Short Exposure ◽  
Imaging Plate ◽  
Image Analyzer ◽  
Single Exposure ◽  
Short Exposure Time ◽  
X Ray ◽  
Area Detector ◽  
Lattice Strains ◽  
Exposure Method

AbstractFor determination of stress in a localized area, we combined a modified single exposure technique and the imaging plate, which is an x-ray digital area detector. With the, single exposure method, stress value is obtained from lattice strains in two directions with a single incident x-ray beam directed at an oblique angle. However, since diffraction data around a whole Debye-Scherrer ring was used in this study, a stress value can be accurately determined in comparison with the single exposure method. We observed the DS ring by use of the imaging plate with requiring only a short exposure time. Lattice strains in many directions on a DS ring were measured by an image analyzer connected to a computer; we verified the effectiveness of this method.

Antigiardiasic activity of Cu(II) coordination compounds: Redox imbalance and membrane damage after a short exposure time

2019 ◽  
Vol 195 ◽  
pp. 83-90 ◽  
Author(s):  
Yadira Rufino-González ◽  
Martha Ponce-Macotela ◽  
Juan Carlos García-Ramos ◽  
Mario N. Martínez-Gordillo ◽  
Rodrigo Galindo-Murillo ◽  
...  
Keyword(s):  
Exposure Time ◽  
Coordination Compounds ◽  
Membrane Damage ◽  
Short Exposure ◽  
Short Exposure Time ◽  
Redox Imbalance

scholarly journals HiSPoD: a program for high-speed polychromatic X-ray diffraction experiments and data analysis on polycrystalline samples

2016 ◽  
Vol 23 (4) ◽  
pp. 1046-1053 ◽  
Author(s):  
Tao Sun ◽  
Kamel Fezzaa
Keyword(s):  
Diffraction Data ◽  
High Speed ◽  
Short Pulse ◽  
Frame Rate ◽  
Short Exposure ◽  
X Rays ◽  
X Ray Diffraction ◽  
Short Exposure Time ◽  
X Ray ◽  
Structure Information

A high-speed X-ray diffraction technique was recently developed at the 32-ID-B beamline of the Advanced Photon Source for studying highly dynamic, yet non-repeatable and irreversible, materials processes. In experiments, the microstructure evolution in a single material event is probed by recording a series of diffraction patterns with extremely short exposure time and high frame rate. Owing to the limited flux in a short pulse and the polychromatic nature of the incident X-rays, analysis of the diffraction data is challenging. Here,HiSPoD, a stand-alone Matlab-based software for analyzing the polychromatic X-ray diffraction data from polycrystalline samples, is described. WithHiSPoD, researchers are able to perform diffraction peak indexing, extraction of one-dimensional intensity profiles by integrating a two-dimensional diffraction pattern, and, more importantly, quantitative numerical simulations to obtain precise sample structure information.

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