X-Ray Analysis of Stress in a Localized Area by Use of Imaging Plate

1991 ◽  
Vol 35 (A) ◽  
pp. 537-543 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Shin'ichi Ohya
Keyword(s):  
Short Exposure ◽  
Imaging Plate ◽  
Image Analyzer ◽  
Single Exposure ◽  
Short Exposure Time ◽  
X Ray ◽  
Area Detector ◽  
Lattice Strains ◽  
Exposure Method

AbstractFor determination of stress in a localized area, we combined a modified single exposure technique and the imaging plate, which is an x-ray digital area detector. With the, single exposure method, stress value is obtained from lattice strains in two directions with a single incident x-ray beam directed at an oblique angle. However, since diffraction data around a whole Debye-Scherrer ring was used in this study, a stress value can be accurately determined in comparison with the single exposure method. We observed the DS ring by use of the imaging plate with requiring only a short exposure time. Lattice strains in many directions on a DS ring were measured by an image analyzer connected to a computer; we verified the effectiveness of this method.

A double-radius Gandolfi X-ray camera for the generation of powder-like diffractograms of small single crystals, using an imaging plate detector

2002 ◽  
Vol 35 (1) ◽  
pp. 13-16 ◽  
Author(s):  
H. H. Otto ◽  
W. Hofmann ◽  
K. Schröder
Keyword(s):  
Single Crystals ◽  
Dynamic Imaging ◽  
Short Exposure ◽  
Imaging Plate ◽  
Data Sets ◽  
Short Exposure Time ◽  
X Ray ◽  
Diffraction Patterns ◽  
Non Destructive ◽  
Plate System

This is a report on the construction and the main features of an X-ray camera following the Debye–Scherrer geometry, combined with a sample mounting and rotation device for single crystals as first suggested by Gandolfi. Doubling of the camera radius and replacing of the wet-film technology by a highly dynamic imaging plate system allows well resolved digital diffraction patterns to be recorded within a short exposure time. Sophisticated calibration, correction and evaluation possibilities are supported by suitable software. Further optional improvements, such as the evacuation of the camera, the adaptation of totally reflecting collimators for an almost parallel primary X-ray beam and a built-in instead of an external imaging plate readout device, will further improve the resolution and peak to background ratio. The simple and versatile apparatus is indispensable for the fast and non-destructive identification of unique mineralogical or technical micro-samples in the form of single-crystal pieces. Initial representative data sets attest to the accuracy, efficiency and sensitivity of the method presented.

Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate

2000 ◽  
Vol 33 (5) ◽  
pp. 1241-1245 ◽  
Author(s):  
A. Fujiwara ◽  
K. Ishii ◽  
T. Watanuki ◽  
H. Suematsu ◽  
H. Nakao ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Performance Test ◽  
High Pressures ◽  
Dynamic Range ◽  
Short Exposure ◽  
Imaging Plate ◽  
High Quality ◽  
Short Exposure Time ◽  
X Ray ◽  
Powder Diffractometer

A synchrotron radiation X-ray powder diffractometer for samples of very small amount has been developed to collect high-quality diffraction patterns under extreme conditions,i.e.at low temperature and/or high pressure. A new cylindrical imaging plate (CIP) is used as a detector, in addition to a conventional flat-type imaging plate (FIP). By using the CIP system, the diffraction data in a diffraction angle range −44 ≤ 2θ ≤ 122° are collected with a dynamic range of about 106. The alignment of the diffractometer, measurement and analysis are automatically operated by a workstation. A performance test shows that the CIP system has spatial resolution of about 0.07° with a dynamic range of 106. The diffraction pattern of a standard sample of Si measured by the CIP system has high quality; the refinement of the structure reachesRw= 3.68% even in the case of a small amount of sample (about 2 µg) and a short exposure time (60 s). Examples of experiments at low temperatures under ambient and high pressures are also presented.

Determination of diffraction time and influence of strip moving speeds on texture measurement using X-ray area detector

Optik ◽  
2019 ◽  
Vol 186 ◽  
pp. 469-478
Author(s):  
Anmin Yin ◽  
Yufan Wang ◽  
Cheng Tao ◽  
Xuedao Shu ◽  
Zhenge Zhu ◽  
...  
Keyword(s):  
Texture Measurement ◽  
X Ray ◽  
Area Detector

Short Exposure Time Characteristics Of X-Ray Generators

1983 ◽  
Author(s):  
Bruce A. Horn ◽  
Kim C. Luk ◽  
David M. Thomasson ◽  
Charles E. Finney
Keyword(s):  
Exposure Time ◽  
Short Exposure ◽  
Short Exposure Time ◽  
X Ray

scholarly journals Neutron Radiography Characteristics of Transfer Exposure Method Using X-ray Imaging Plate

2018 ◽  
Vol 17 (2) ◽  
pp. 33-41
Author(s):  
Hiroyuki UNO ◽  
Ryuji UEMOTO ◽  
Koichi NITTOH ◽  
Shiro SOGABE ◽  
Yukio SONODA ◽  
...  
Keyword(s):  
Neutron Radiography ◽  
Imaging Plate ◽  
X Ray ◽  
X Ray Imaging ◽  
Exposure Method

scholarly journals HiSPoD: a program for high-speed polychromatic X-ray diffraction experiments and data analysis on polycrystalline samples

2016 ◽  
Vol 23 (4) ◽  
pp. 1046-1053 ◽  
Author(s):  
Tao Sun ◽  
Kamel Fezzaa
Keyword(s):  
Diffraction Data ◽  
High Speed ◽  
Short Pulse ◽  
Frame Rate ◽  
Short Exposure ◽  
X Rays ◽  
X Ray Diffraction ◽  
Short Exposure Time ◽  
X Ray ◽  
Structure Information

A high-speed X-ray diffraction technique was recently developed at the 32-ID-B beamline of the Advanced Photon Source for studying highly dynamic, yet non-repeatable and irreversible, materials processes. In experiments, the microstructure evolution in a single material event is probed by recording a series of diffraction patterns with extremely short exposure time and high frame rate. Owing to the limited flux in a short pulse and the polychromatic nature of the incident X-rays, analysis of the diffraction data is challenging. Here,HiSPoD, a stand-alone Matlab-based software for analyzing the polychromatic X-ray diffraction data from polycrystalline samples, is described. WithHiSPoD, researchers are able to perform diffraction peak indexing, extraction of one-dimensional intensity profiles by integrating a two-dimensional diffraction pattern, and, more importantly, quantitative numerical simulations to obtain precise sample structure information.

Rapid small-angle X-ray diffraction of a tonically contracting molluscan smooth muscle recorded with imaging plates

1989 ◽  
Vol 22 (1) ◽  
pp. 72-74 ◽  
Author(s):  
Y. Tajima ◽  
K. Okada ◽  
O. Yoshida ◽  
T. Seto ◽  
Y. Amemiya
Keyword(s):  
Small Angle ◽  
Structural Changes ◽  
High Sensitivity ◽  
Imaging Plate ◽  
Layer Line ◽  
X Ray Diffraction ◽  
Thin Filaments ◽  
X Ray ◽  
Area Detector ◽  
Diffraction Patterns

Small-angle X-ray diffraction patterns from the anterior byssus retractor muscles of Mytilus edulis contracting tonically in response to stimulation with acetylcholine were recorded in a 30 s exposure with synchrotron radiation and a high-sensitivity X-ray area detector called an imaging plate. The 190 Å layer line from the thin filaments increased in intensity with increase in tonic tension up to 6 x 104 kg m−2. Above this value, the layer-line intensity remained almost constant and comparable to that for a contracting skeletal muscle, indicating that the same structural changes of the thin filaments occur in both muscles.

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