X-Ray Calibration Of The Rosat Position Sensitive Proportional Counter II. The Energy Calibration

Author(s):  
U. G. Briel ◽  
W. Burkert ◽  
E. Pfeffermann
1984 ◽  
Vol 17 (5) ◽  
pp. 337-343 ◽  
Author(s):  
O. Yoda

A high-resolution small-angle X-ray scattering camera has been built, which has the following features. (i) The point collimation optics employed allows the scattering cross section of the sample to be directly measured without corrections for desmearing. (ii) A small-angle resolution better than 0.5 mrad is achieved with a camera length of 1.6 m. (iii) A high photon flux of 0.9 photons μs−1 is obtained on the sample with the rotating-anode X-ray generator operated at 40 kV–30 mA. (iv) Incident X-rays are monochromated by a bent quartz crystal, which makes the determination of the incident X-ray intensity simple and unambiguous. (v) By rotation of the position-sensitive proportional counter around the direct beam, anisotropic scattering patterns can be observed without adjusting the sample. Details of the design and performance are presented with some applications.


1978 ◽  
Vol 22 ◽  
pp. 233-240 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki

A position-sensitive proportional counter suitable for the X-ray stress measurement has been developed and residual stresses were measured with an apparatus that uses this PSD system. The counter was designed to have a good angular resolution over the counter length for the diffracted X-ray beam and high counting rates. The mean angular resolution measured was about 0.2° in 2θ (FWHM) at 200 mm, and the maximum allowable counting rate reached about 40,000 cps.The time required for the data accumulation was shown to be 1/10 to 1/30 of the time required with a standard diffractometer.


1980 ◽  
Vol 27 (1) ◽  
pp. 196-203 ◽  
Author(s):  
J. Davelaar ◽  
G. Manzo ◽  
A. Peacock ◽  
B. G. Taylor ◽  
J. A. M. Bleeker

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