scholarly journals Supplemental Material: Initial uplift of the Qilian Shan, northern Tibet since ca. 25 Ma: Implications for regional tectonics and origin of eolian deposition in Asia

Author(s):  
Haijian Lu ◽  
et al.

Supplemental dataset: Detrital zircon U-Pb ages of the sandstone samples from the Lulehe and Hongshangou sections; Figure S1: SEM images of 129 grains from sandstone sample LLH-1 showing grain roundness characteristics; Figure S2: SEM images of 140 grains from sandstone sample LLH-2 showing grain roundness characteristics; Figure S3: SEM images of 123 grains from sandstone sample LLH-3 showing grain roundness characteristics; Figure S4: SEM images of 122 grains from sandstone sample HSG-7 showing grain roundness characteristics; Figure S5: SEM images of 123 grains from sandstone sample HSG-8 showing grain roundness characteristics; Figure S6: SEM images of 123 grains from sandstone sample HSG-9 showing grain roundness characteristics; Figure S7: SEM images of representative grains from the Lulehe and Hongshangou sections showing surface microtextures.

2022 ◽  
Author(s):  
Haijian Lu ◽  
et al.

Supplemental dataset: Detrital zircon U-Pb ages of the sandstone samples from the Lulehe and Hongshangou sections; Figure S1: SEM images of 129 grains from sandstone sample LLH-1 showing grain roundness characteristics; Figure S2: SEM images of 140 grains from sandstone sample LLH-2 showing grain roundness characteristics; Figure S3: SEM images of 123 grains from sandstone sample LLH-3 showing grain roundness characteristics; Figure S4: SEM images of 122 grains from sandstone sample HSG-7 showing grain roundness characteristics; Figure S5: SEM images of 123 grains from sandstone sample HSG-8 showing grain roundness characteristics; Figure S6: SEM images of 123 grains from sandstone sample HSG-9 showing grain roundness characteristics; Figure S7: SEM images of representative grains from the Lulehe and Hongshangou sections showing surface microtextures.


2021 ◽  
Author(s):  
Erin E. Donaghy ◽  
et al.

(1) Descriptions of spatial and temporal stratigraphic thickness variations in the Chumstick basin and methods for sediment accumulation rate calculations, (2) Detailed descriptions and photographs of each lithofacies association of the Chumstick Formation defined in the text of the manuscript, (3) Tables of raw and summary conglomerate clast count data for each member of the Chumstick Formation, (4) Summary tables of conglomerate detrital modes for each member of the Chumstick Formation, (5) Summary tables and age probability plots of detrital zircon ages from each sandstone sample collected within the Chumstick Formation, (6) Conglomerate clast raw data from LaCasse (2013) and (7) Tables of detrital zircon raw data from each individual sandstone sample within the Chumstick Formation (Donaghy, 2015).


2021 ◽  
Author(s):  
Erin E. Donaghy ◽  
et al.

(1) Descriptions of spatial and temporal stratigraphic thickness variations in the Chumstick basin and methods for sediment accumulation rate calculations, (2) Detailed descriptions and photographs of each lithofacies association of the Chumstick Formation defined in the text of the manuscript, (3) Tables of raw and summary conglomerate clast count data for each member of the Chumstick Formation, (4) Summary tables of conglomerate detrital modes for each member of the Chumstick Formation, (5) Summary tables and age probability plots of detrital zircon ages from each sandstone sample collected within the Chumstick Formation, (6) Conglomerate clast raw data from LaCasse (2013) and (7) Tables of detrital zircon raw data from each individual sandstone sample within the Chumstick Formation (Donaghy, 2015).


Author(s):  
M. D. Coutts ◽  
E. R. Levin

On tilting samples in an SEM, the image contrast between two elements, x and y often decreases to zero at θε, which we call the no-contrast angle. At angles above θε the contrast is reversed, θ being the angle between the specimen normal and the incident beam. The available contrast between two elements, x and y, in the SEM can be defined as,(1)where ix and iy are the total number of reflected and secondary electrons, leaving x and y respectively. It can easily be shown that for the element x,(2)where ib is the beam current, isp the specimen absorbed current, δo the secondary emission at normal incidence, k is a constant, and m the reflected electron coefficient.


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