Polarization-modulation spectroscopy of linear dichroism in uniaxially deformed silicon crystals

2003 ◽  
Vol 94 (1) ◽  
pp. 33-37 ◽  
Author(s):  
E. F. Venger ◽  
I. E. Matyash ◽  
B. K. Serdega
Keyword(s):  
Linear Dichroism ◽  
Polarization Modulation ◽  
Modulation Spectroscopy ◽  
Silicon Crystals

Polarization modulation spectroscopy of surface plasmon resonance

2008 ◽  
Vol 105 (2) ◽  
pp. 257-264 ◽  
Author(s):  
L. J. Berezhinsky ◽  
L. S. Maksimenko ◽  
I. E. Matyash ◽  
S. P. Rudenko ◽  
B. K. Serdega
Keyword(s):  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Plasmon Resonance ◽  
Polarization Modulation ◽  
Modulation Spectroscopy

Recent progress in vacuum-ultraviolet polarization modulation spectroscopy using polarizing undulator at the TERAS BL5 beamline

2007 ◽  
Vol 78 (12) ◽  
pp. 123106 ◽  
Author(s):  
Kazutoshi Yagi-Watanabe ◽  
Masahito Tanaka ◽  
Fusae Kaneko ◽  
Kazumichi Nakagawa
Keyword(s):  
Recent Progress ◽  
Vacuum Ultraviolet ◽  
Polarization Modulation ◽  
Modulation Spectroscopy

Theory of High Frequency Differential Interferometry: Application to the Measurement of Infrared Circular and Linear Dichroism via Fourier Transform Spectroscopy

1979 ◽  
Vol 33 (2) ◽  
pp. 130-135 ◽  
Author(s):  
Laurence A. Nafie ◽  
Max Diem
Keyword(s):  
Fourier Transform ◽  
High Frequency ◽  
Linear Dichroism ◽  
Periodic Variation ◽  
Polarization Modulation ◽  
Differential Absorption ◽  
Differential Interferometry ◽  
Infrared Spectrometer ◽  
Alternate States ◽  
General Method

A general method for the direct measurement of differential absorption intensities using a Fourier transform infrared spectrometer is described. The differential intensities must be higher in frequency than the interferogram frequencies and may arise from a periodic variation of the absorption strength of the sample, or by dichroic response of the sample to alternate states of polarization of the infrared beam. Specific expressions are presented for the measurement of circular and linear dichroism. These expressions represent an extension of the Grosjean-Legrand polarization modulation technique to Fourier transform interferometry.

The Optical Rotatory Dispersion and Linear Dichroism Option of the JASCO J-500 A-Type CD Spectropolarimeter

1989 ◽  
Vol 43 (8) ◽  
pp. 1471-1475 ◽  
Author(s):  
Yohji Shindo ◽  
Hiroshi Hayakawa ◽  
Masahiro Sudani
Keyword(s):  
Optical Axis ◽  
High Sensitivity ◽  
Linear Dichroism ◽  
Null Point ◽  
Optical Rotatory Dispersion ◽  
Polarization Modulation ◽  
Know How ◽  
Harmonic Rejection ◽  
Lock In ◽  
Point Detection

We have made an ORD option for our JASCO J-500 A-type CD spectrometer based on the know-how obtained from the studies of our new polarization-modulation spectrometer. The Mueller matrix approach is used to analyze and evaluate important factors determining the performance of our ORD option. These are (1) the harmonic rejection and “in band” overload capability of the lock-in amplifier, (2) the position of the analyzer's optical axis, (3) the residual static birefringence of the PEM. The capability of our ORD option is equal to that of commercially available ORD spectropolarimeters, in the range from 200 to 700 nm. Furthermore, our option has much faster speed for ORD measurements than does the ORD spectropolarimeter of the null-point detection type. Our ORD option can also be used to measure linear dichroism in high sensitivity.

Exploiting Anisotropy of Plasmonic Nanostructures with Polarization Modulation Infrared Linear Dichroism Microscopy (µPM-IRLD)

2018 ◽  
Vol 6 (6) ◽  
pp. 1701336 ◽  
Author(s):  
Gregory Q. Wallace ◽  
Stuart T. Read ◽  
Danielle M. McRae ◽  
Scott M. Rosendahl ◽  
François Lagugné-Labarthet
Keyword(s):  
Linear Dichroism ◽  
Plasmonic Nanostructures ◽  
Polarization Modulation
Sign in / Sign up

Export Citation Format

Share Document