Bias voltage dependent shift of the atomic-scale structure of a Ge(111)-(2 × 1) reconstructed surface measured by low temperature scanning tunneling microscopy

JETP Letters ◽  
2007 ◽  
Vol 85 (6) ◽  
pp. 277-282 ◽  
Author(s):  
P. I. Arseyev ◽  
N. S. Maslova ◽  
V. I. Panov ◽  
S. V. Savinov ◽  
C. Van Haesendonck
Keyword(s):  
Low Temperature ◽  
Scanning Tunneling Microscopy ◽  
Bias Voltage ◽  
Scale Structure ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Voltage Dependent ◽  
Reconstructed Surface ◽  
Temperature Scanning

Self-assembly of l-tryptophan on Cu(111) studied by low-temperature scanning tunneling microscopy

2019 ◽  
Vol 30 (12) ◽  
pp. 2355-2358 ◽  
Author(s):  
Qiang Xue ◽  
Yajie Zhang ◽  
Ruoning Li ◽  
Chao Li ◽  
Na Li ◽  
...  
Keyword(s):  
Low Temperature ◽  
Scanning Tunneling Microscopy ◽  
Self Assembly ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Temperature Scanning
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