Investigation of Plasma Oscillations in Glasslike Dielectrics by Means of Total External Reflection of X Rays

2020 ◽  
Vol 65 (7) ◽  
pp. 1071-1075
Author(s):  
V. M. Stozharov
Keyword(s):  
Total External Reflection ◽  
X Rays ◽  
Plasma Oscillations

scholarly journals Определение плазменных колебаний в металлах методом полного внешнего отражения рентгеновских лучей

2019 ◽  
Vol 89 (7) ◽  
pp. 1036
Author(s):  
В.М. Стожаров
Keyword(s):  
Energy Concentration ◽  
Total External Reflection ◽  
X Rays ◽  
Plasmon Energy ◽  
Plasma Oscillations ◽  
Conduction Electrons ◽  
Grazing Angles

AbstractA method to determine plasma oscillations in metals with the aid of total external reflection (TER) of X-rays is proposed. It is shown that the plasmon energy, concentration of conduction electrons, and Fermi energies can be calculated using experimentally measured grazing angles of X-rays after TER. Such characteristics depend on crystallographic directions and may depend on the TER depth.

scholarly journals Исследование этапов превращения кремния в карбид кремния в процессе атомного замещения методами полного внешнего отражения рентгеновских лучей и рентгеновской дифрактомерии

2022 ◽  
Vol 64 (3) ◽  
pp. 326
Author(s):  
С.А. Кукушкин ◽  
А.В. Осипов ◽  
Е.В. Осипова ◽  
В.М. Стожаров
Keyword(s):  
Structural Quality ◽  
Total External Reflection ◽  
X Rays ◽  
Reflection Method ◽  
X Ray Diffraction ◽  
Modified Technique ◽  
Substitution Method ◽  
X Ray ◽  
Sic Films

X-ray diffraction and total external reflection of X-rays (X-ray reflectometry) methods were used to study the successive stages of synthesis of epitaxial SiC films on Si (100) X-ray diffraction and total external X-ray reflection (XRD) methods were used to study successive stages of synthesis of epitaxial SiC films on Si (100) surfaces, (110) and (111) surfaces by the atom substitution method. The data on the transformation evolution of (100) surfaces were studied, (110) and (111) Si, into SiC surfaces. A comparative analysis of the X-ray structural quality of the SiC layers grown on Si by the atom substitution method with the quality of SiC layers grown by Advanced Epi by the standard CVD method. A modified technique for the total outer X-ray reflection method, based on measurements of the intensity of the reflected X-rays using a special parabolic mirror. It is shown that the method of total external reflection method makes it possible to obtain important information about the degree of surface roughness of SiC layers, the evolution of their crystal structure and plasmon energy in the process of Si to SiC conversion.

Overview of polycapillary X-ray optics

2002 ◽  
Vol 17 (2) ◽  
pp. 70-80 ◽  
Author(s):  
Paul J. Schields ◽  
David M. Gibson ◽  
Walter M. Gibson ◽  
Ning Gao ◽  
Huapeng Huang ◽  
...  
Keyword(s):  
Focal Spot ◽  
State Of The Art ◽  
Substantial Reduction ◽  
Spot Size ◽  
Source Size ◽  
Total External Reflection ◽  
X Rays ◽  
Focal Spot Size ◽  
Polycapillary Optics ◽  
X Ray

Polycapillary optics are utilized in a wide variety of applications and are integral components in many state of the art instruments. Polycapillary optics operate by collecting X-rays and efficiently propagating them by total external reflection to form focused and parallel beams. We discuss the general parameters for designing these optics and provide specific examples on balancing the interrelations of beam flux, source size, focal spot-size, and beam divergence. The development of compact X-ray sources with characteristics tailored to match the requirements of polycapillary optics allows substantial reduction in size, weight, and power of complete X-ray systems. These compact systems have enabled the development of portable, remote, and in-line sensors for applications in industry, science and medicine. We present examples of the utility and potential of these optics for enhancing a wide variety of X-ray analyses.

Total External Reflection of X Rays from Polycrystal Solid Surface

2017 ◽  
Vol 62 (12) ◽  
pp. 1899-1902 ◽  
Author(s):  
V. M. Stozharov ◽  
V. P. Pronin
Keyword(s):  
Solid Surface ◽  
Total External Reflection ◽  
X Rays

Scanning X-Ray Analytical Microscope using X-Ray Guide Tube

1991 ◽  
Vol 35 (B) ◽  
pp. 1289-1293
Author(s):  
Shuichi Shimomura ◽  
Hiromoto Nakazawa
Keyword(s):  
Thin Section ◽  
Small Area ◽  
Total External Reflection ◽  
Guide Tube ◽  
X Rays ◽  
Glass Capillary ◽  
X Ray ◽  
Plane Normal

AbstractA scanning X-ray analytical microscope was constructed using X-ray guide tube(XGT). XGT is a glass capillary which guides and focuses x-rays by total external reflection at the inner wall. The nature of X-ray beam passed through XGT is varied depending on the form of XGT. The cylindrical and conical types were used for the present setup. A small area (10μm × 10μm) of the sample was irradiated by the X-ray microbeam formed by XGT. Fluorescent and diffracted X-rays from the small area were detected by SSD. By scanning the sample in the plane normal to the X-ray microbeam, the intensity distributions of such secondary x-rays were measured and used as picture elements for constructing x-ray mapping images. The sample was a thin-section of an old chinaware. The images suggest a wide application of this instrument.

Focusing of X-rays by Total External Reflection from a Paraboloidally Tapered Glass Capillary

1995 ◽  
Vol 2 (6) ◽  
pp. 296-299 ◽  
Author(s):  
D. X. Balaic ◽  
K. A. Nugent ◽  
Z. Barnea ◽  
R. Garrett ◽  
S. W. Wilkins
Keyword(s):  
Total External Reflection ◽  
X Rays ◽  
Glass Capillary

scholarly journals Исследование плазменных колебаний в стеклообразных диэлектриках методом полного внешнего отражения рентгеновских лучей

2020 ◽  
Vol 90 (7) ◽  
pp. 1116
Author(s):  
В.М. Стожаров
Keyword(s):  
Dipole Moment ◽  
Single Crystal ◽  
Mechanical Stress ◽  
Lithium Fluoride ◽  
Total External Reflection ◽  
X Rays ◽  
Internal Mechanical Stress ◽  
Plasmon Dispersion ◽  
Localized Electrons

Glass-like dielectrics are studied by methods of plasmon dispersion and asymmetry of the number of localized electrons in the zone of formation of the total external reflection of x-rays and the excitation of plasma vibrations. Defined by the internal mechanical stress and the associated polarization of the investigated dielectrics. The absence of internal mechanical stress in a single crystal of lithium fluoride was found out, and the observed polarization is caused by a large macroscopic dipole moment in this single crystal

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