scholarly journals Определение плазменных колебаний в металлах методом полного внешнего отражения рентгеновских лучей

2019 ◽  
Vol 89 (7) ◽  
pp. 1036
Author(s):  
В.М. Стожаров
Keyword(s):  
Energy Concentration ◽  
Total External Reflection ◽  
X Rays ◽  
Plasmon Energy ◽  
Plasma Oscillations ◽  
Conduction Electrons ◽  
Grazing Angles

AbstractA method to determine plasma oscillations in metals with the aid of total external reflection (TER) of X-rays is proposed. It is shown that the plasmon energy, concentration of conduction electrons, and Fermi energies can be calculated using experimentally measured grazing angles of X-rays after TER. Such characteristics depend on crystallographic directions and may depend on the TER depth.

scholarly journals Исследование этапов превращения кремния в карбид кремния в процессе атомного замещения методами полного внешнего отражения рентгеновских лучей и рентгеновской дифрактомерии

2022 ◽  
Vol 64 (3) ◽  
pp. 326
Author(s):  
С.А. Кукушкин ◽  
А.В. Осипов ◽  
Е.В. Осипова ◽  
В.М. Стожаров
Keyword(s):  
Structural Quality ◽  
Total External Reflection ◽  
X Rays ◽  
Reflection Method ◽  
X Ray Diffraction ◽  
Modified Technique ◽  
Substitution Method ◽  
X Ray ◽  
Sic Films

X-ray diffraction and total external reflection of X-rays (X-ray reflectometry) methods were used to study the successive stages of synthesis of epitaxial SiC films on Si (100) X-ray diffraction and total external X-ray reflection (XRD) methods were used to study successive stages of synthesis of epitaxial SiC films on Si (100) surfaces, (110) and (111) surfaces by the atom substitution method. The data on the transformation evolution of (100) surfaces were studied, (110) and (111) Si, into SiC surfaces. A comparative analysis of the X-ray structural quality of the SiC layers grown on Si by the atom substitution method with the quality of SiC layers grown by Advanced Epi by the standard CVD method. A modified technique for the total outer X-ray reflection method, based on measurements of the intensity of the reflected X-rays using a special parabolic mirror. It is shown that the method of total external reflection method makes it possible to obtain important information about the degree of surface roughness of SiC layers, the evolution of their crystal structure and plasmon energy in the process of Si to SiC conversion.

Diffuse Scattering of X-Rays by Conduction Electrons

1935 ◽  
Vol 48 (7) ◽  
pp. 573-576 ◽  
Author(s):  
Clarence Zener
Keyword(s):  
Diffuse Scattering ◽  
X Rays ◽  
Conduction Electrons

THE EFFECT OF THE ELECTRON CORRELATION ON THE ELECTRICAL RESISTIVITY OF LIQUID METALS

1963 ◽  
Vol 41 (9) ◽  
pp. 1397-1404
Author(s):  
Hirohisa Endo ◽  
Shota Suekane
Keyword(s):  
Electrical Resistivity ◽  
Liquid Metals ◽  
Elementary Theory ◽  
Mean Free Path ◽  
Liquid Sodium ◽  
Electron Model ◽  
Plasma Oscillations ◽  
Effective Electron ◽  
Conduction Electrons ◽  
Ion Interactions

An elementary theory of the electrical resistivity of monovalent liquid metals is given. On using the theory of the plasma oscillations of conduction electrons, the electron–ion interactions are separated into two parts: one gives the effective electron–ion interactions which are screened as the result of the effects of the plasma oscillations of the conduction electrons and contributes directly to the electrical resistivity; the other describes the interactions between the ions and the plasma oscillations. The screened electron–ion interaction is defined as the pseudo-potential of the ion.The theory constructed on the basis of the free-electron model is applied in the first instance to estimate the electrical resistivity of liquid sodium near the melting point. Callaway's potential and the correlation function of ions determined from neutron diffraction experiments are used and the mean free path of a conduction electron is calculated numerically. Therefore, in our theory, the "plasma term" and the "structure term" of Ziman's theory are not treated separately.

Overview of polycapillary X-ray optics

2002 ◽  
Vol 17 (2) ◽  
pp. 70-80 ◽  
Author(s):  
Paul J. Schields ◽  
David M. Gibson ◽  
Walter M. Gibson ◽  
Ning Gao ◽  
Huapeng Huang ◽  
...  
Keyword(s):  
Focal Spot ◽  
State Of The Art ◽  
Substantial Reduction ◽  
Spot Size ◽  
Source Size ◽  
Total External Reflection ◽  
X Rays ◽  
Focal Spot Size ◽  
Polycapillary Optics ◽  
X Ray

Polycapillary optics are utilized in a wide variety of applications and are integral components in many state of the art instruments. Polycapillary optics operate by collecting X-rays and efficiently propagating them by total external reflection to form focused and parallel beams. We discuss the general parameters for designing these optics and provide specific examples on balancing the interrelations of beam flux, source size, focal spot-size, and beam divergence. The development of compact X-ray sources with characteristics tailored to match the requirements of polycapillary optics allows substantial reduction in size, weight, and power of complete X-ray systems. These compact systems have enabled the development of portable, remote, and in-line sensors for applications in industry, science and medicine. We present examples of the utility and potential of these optics for enhancing a wide variety of X-ray analyses.

Evolution of the magnetic hyperfine field profiles in an ion-irradiated Fe60Al40 film measured by nuclear resonant reflectivity

2021 ◽  
Vol 28 (5) ◽  
Author(s):  
Marina Andreeva ◽  
Alevtina Smekhova ◽  
Roman Baulin ◽  
Yurii Repchenko ◽  
Rantej Bali ◽  
...  
Keyword(s):  
Critical Angle ◽  
Depth Distribution ◽  
Magnetic Hyperfine Field ◽  
Resonant Scattering ◽  
Magnetic Hyperfine ◽  
Total External Reflection ◽  
Hyperfine Fields ◽  
Depth Profiles ◽  
Bottom Interface ◽  
Grazing Angles

Nuclear resonant reflectivity (NRR) from an Fe60Al40 film was measured using synchrotron radiation at several grazing angles near the critical angle of total external reflection. Using laterally resolved measurements after irradiation with 20 keV Ne+ ions of gradually varying fluence of 0–3.0 × 1014 ions cm−2, the progressive creation of the ferromagnetic A2 phase with increasing ion fluence was confirmed. The observed depth selectivity of the method has been explained by application of the standing wave approach. From the time spectra of the nuclear resonant scattering in several reflection directions the depth profiles for different hyperfine fields were extracted. The results show that the highest magnetic hyperfine fields (∼18–23 T) are initially created in the central part of the film and partially at the bottom interface with the SiO2 substrate. The evolution of the ferromagnetic onset, commencing at a fixed depth within the film and propagating towards the interfaces, has been directly observed. At higher fluence (3.0 × 1014 ions cm−2) the depth distribution of the ferromagnetic fractions became more homogeneous across the film depth, in accordance with previous results.

Total External Reflection of X Rays from Polycrystal Solid Surface

2017 ◽  
Vol 62 (12) ◽  
pp. 1899-1902 ◽  
Author(s):  
V. M. Stozharov ◽  
V. P. Pronin
Keyword(s):  
Solid Surface ◽  
Total External Reflection ◽  
X Rays
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