New method of parasitic mode suppression in lateral-field-excited piezoelectric resonator

This paper proposes a new method for characterization of 2D materials under the precisely specified conditions. It is achieved by integration of a 2D material as a field effect transistors structures with a piezoelectric resonator. Properties of the 2D material can be mechanically adjusted by the resonator. It results in the independent and precise control of an amplitude of induced mechanical strain, its modulating frequency, which all influence the 2D material properties. The electrical field required to measure 2D material field effect transistors will not be affected by the vibrations, thus giving us a chance to perform the precise measurement of the electrical properties of the 2D material. This approach has a great potential for measuring and monitoring cells, enzymes, nucleic acids, deoxyribonucleic acid and ribonucleic acid. It can be also used for measurement of toxic, combustive or waste gases.

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Parasitic mode suppression in coaxial resonator for MBK

2011 IEEE International Vacuum Electronics Conference (IVEC) ◽

10.1109/ivec.2011.5746962 ◽

2011 ◽

Author(s):

Hui-Peng Han ◽

Yong Wang

Keyword(s):

Parasitic Mode ◽

Coaxial Resonator ◽

Mode Suppression

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Selective Sampling and Orientation of Non-Homogeneous Tissues

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100100238 ◽

1968 ◽

Vol 26 ◽

pp. 98-99

Author(s):

C. C. Clawson ◽

L. W. Anderson ◽

R. A. Good

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

Light Microscopy ◽

Random Sampling ◽

New Method ◽

Microscope Examination ◽

Small Areas ◽

Selective Sampling ◽

Large Numbers ◽

Specific Orientation

Investigations which require electron microscope examination of a few specific areas of non-homogeneous tissues make random sampling of small blocks an inefficient and unrewarding procedure. Therefore, several investigators have devised methods which allow obtaining sample blocks for electron microscopy from region of tissue previously identified by light microscopy of present here techniques which make possible: 1) sampling tissue for electron microscopy from selected areas previously identified by light microscopy of relatively large pieces of tissue; 2) dehydration and embedding large numbers of individually identified blocks while keeping each one separate; 3) a new method of maintaining specific orientation of blocks during embedding; 4) special light microscopic staining or fluorescent procedures and electron microscopy on immediately adjacent small areas of tissue.

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