X-ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source

2014 ◽  
pp. 53-81 ◽  
Author(s):  
Wenjun Liu ◽  
Gene E. Ice
Keyword(s):  
Laue Diffraction ◽  
X Ray ◽  
Diffraction Microscopy ◽  
Photon Source

scholarly journals X‐ray Laue Diffraction Microscopy in 3D at the Advanced Photon Source

2011 ◽  
Author(s):  
W. Liu ◽  
P. Zschack ◽  
J. Tischler ◽  
G. Ice ◽  
B. Larson
Keyword(s):  
Laue Diffraction ◽  
X Ray ◽  
Diffraction Microscopy ◽  
Photon Source

Probing Microstructure Dynamics With X-Ray Diffraction Microscopy

2008 ◽  
Vol 130 (2) ◽  
Author(s):  
R. M. Suter ◽  
C. M. Hefferan ◽  
S. F. Li ◽  
D. Hennessy ◽  
C. Xiao ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Forward Modeling ◽  
X Ray Diffraction ◽  
X Ray ◽  
Modeling Analysis ◽  
Wide Line ◽  
Diffraction Microscopy ◽  
Focused Beam ◽  
Photon Source

We describe our recent work on developing X-ray diffraction microscopy as a tool for studying three dimensional microstructure dynamics. This is a measurement technique that is demanding of experimental hardware and presents a challenging computational problem to reconstruct the sample microstructure. A dedicated apparatus exists at beamline 1-ID of the Advanced Photon Source for performing these measurements. Submicron mechanical precision is combined with focusing optics that yield ≈2μmhigh×1.3mm wide line focused beam at 50keV. Our forward modeling analysis approach generates diffraction from a simulated two dimensional triangular mesh. Each mesh element is assigned an independent orientation by optimizing the fit to experimental data. The method is computationally demanding but is adaptable to parallel computation. We illustrate the state of development by measuring and reconstructing a planar section of an aluminum polycrystal microstructure. An orientation map of ∼90 grains is obtained along with a map showing the spatial variation in the quality of the fit to the data. Sensitivity to orientation variations within grains is on the order of 0.1deg. Volumetric studies of the response of microstructures to thermal or mechanical treatment will soon become practical. It should be possible to incorporate explicit treatment of defect distributions and to observe their evolution.

VHCF damage in duplex stainless steel revealed by microbeam energy-dispersive X-ray Laue diffraction

2021 ◽  
pp. 106358
Author(s):  
Ali Abboud ◽  
Ali AlHassan ◽  
Benjamin Dönges ◽  
Jean Sebastian Micha ◽  
Robert Hartmann ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Duplex Stainless Steel ◽  
Energy Dispersive ◽  
Laue Diffraction ◽  
X Ray

Determining the energy-dependent X-ray flux variation of a synchrotron beamline using Laue diffraction patterns

2011 ◽  
Vol 44 (1) ◽  
pp. 177-183 ◽  
Author(s):  
Catherine Dejoie ◽  
Martin Kunz ◽  
Nobumichi Tamura ◽  
Colin Bousige ◽  
Kai Chen ◽  
...  
Keyword(s):  
Incident Energy ◽  
Flux Variation ◽  
Laue Diffraction ◽  
X Ray ◽  
Measured Flux ◽  
Highly Sensitive ◽  
Diffraction Patterns ◽  
Energy Dependent ◽  
Flux Curve

Although the spectrum originating from a superconducting bending magnet is quasi-continuous, it shows important intensity variations through its spectral range. A method to determine the incident energy-dependent flux variation based on the comparison between observed intensities and the calculated intensities of a well known structure (calcite) is presented here. It is found that the measured flux is highly sensitive to the use of correct Debye–Waller factors for the atoms of the standard crystal. By using the measured flux curve, it was possible to unambiguously index the Laue diffraction pattern of a trigonal crystal structure in its hexagonal setting. This is a crucial but difficult first step for the determination of strain and stress in materials with this symmetry, such as quartz, Mg, Ti, Znetc.

Design and characterization of an undulator beamline optimized for small-angle coherent X-ray scattering at the Advanced Photon Source

1999 ◽  
Vol 6 (6) ◽  
pp. 1174-1184 ◽  
Author(s):  
A. R. Sandy ◽  
L. B. Lurio ◽  
S. G. J. Mochrie ◽  
A. Malik ◽  
G. B. Stephenson ◽  
...  
Keyword(s):  
Small Angle ◽  
X Ray ◽  
X Ray Scattering ◽  
Photon Source ◽  
Ray Scattering

scholarly journals Developing the XEOL and TR-XEOL at the X-ray Nanoprobe at Taiwan Photon Source

2018 ◽  
Vol 24 (S2) ◽  
pp. 200-201 ◽  
Author(s):  
Bi-Hsuan Lin ◽  
Shao-Chin Tseng ◽  
Xiao-Yun Li ◽  
Dai-Jie Lin ◽  
Hsu-Cheng Hsu ◽  
...  
Keyword(s):  
X Ray ◽  
Photon Source

Magnetization, micro-x-ray fluorescence, and transmission electron microscopy studies of low concentrations of nanoscale Fe3O4 particles in epoxy resin

2000 ◽  
Vol 15 (11) ◽  
pp. 2488-2493 ◽  
Author(s):  
A. N. Thorpe ◽  
F. E. Senftle ◽  
M. Holt ◽  
J. Grant ◽  
W. Lowe ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Epoxy Resin ◽  
Magnetization Measurements ◽  
X Ray ◽  
Transmission Electron ◽  
Low Concentrations ◽  
Magnetite Particles ◽  
Spherical Agglomerates ◽  
Photon Source

Magnetization measurements, transmission electron microscopy (TEM), and high-resolution micro-x-ray fluorescence (μ-XRF) using a synchrotron radiation source (Advanced Photon Source) were used to examine Fe3O4 particle agglomerates of nominally 10-nm particles at low concentrations (down to 0.03%) in thick epoxy resin samples. The magnetization measurements showed that at low concentrations (<0.5%) the magnetite particles, although closely packed in the agglomerates, did not interact magnetically. Predicated on a 2-μm sample step scan, the μ-XRF results were compatible with the presence of spherical agglomerates due to magnetostatic attraction, and these ranged in size from 100 to several thousand nanometers, as observed in TEM measurements. At smaller step scans the resolution could be significantly improved. Thus, the synchroton μ-XRF method was very useful in detecting very small concentrations of particles in thick samples and could probably be used to detect particles in amounts as low as 10−16 g.

Sign in / Sign up

Export Citation Format

Share Document