Full Error Detection and Correction Method Applied on Pipelined Structure Using Two Approaches

2020 ◽  
Vol 29 (13) ◽  
pp. 2050218 ◽  
Author(s):  
Mehmed Dug ◽  
Stefan Weidling ◽  
Egor Sogomonyan ◽  
Dejan Jokic ◽  
Milos Krstic

In this paper, two approaches are evaluated using the Full Error Detection and Correction (FEDC) method for a pipelined structure. The approaches are referred to as Full Duplication with Comparison (FDC) and Concurrent Checking with Parity Prediction (CCPP). Aforementioned approaches are focused on the borderline cases of FEDC method which implement Error Detection Circuit (EDC) in two manners for the purpose of protection of combinational logic to address the soft errors of unspecified duration. The FDC approach implements a full duplication of the combinational circuit, as the most complex and expensive implementation of the FEDC method, and the CCPP approach implements only the parity prediction bit, being the simplest and cheapest technique, for soft error detection. Both approaches are capable of detecting soft errors in the combinational logic, with single faults being injected into the design. On the one hand, the FDC approach managed to detect and correct all injected faults while the CCPP approach could not detect multiple faults created at the output of combinational circuit. On the other hand, the FDC approach leads to higher power consumption and area increase compared to the CCPP approach.

2021 ◽  
Author(s):  
Jalal Mohammad Chikhe

Due to the reduction of transistor size, modern circuits are becoming more sensitive to soft errors. The development of new techniques and algorithms targeting soft error detection are important as they allow designers to evaluate the weaknesses of the circuits at an early stage of the design. The project presents an optimized implementation of soft error detection simulator targeting combinational circuits. The developed simulator uses advanced switch level models allowing the injection of soft errors caused by single event-transient pulses with magnitudes lesser than the logic threshold. The ISCAS'85 benchmark circuits are used for the simulations. The transients can be injected at drain, gate, or inputs of logic gate. This gives clear indication of the importance of transient injection location on the fault coverage. Furthermore, an algorithm is designed and implemented in this work to increase the performance of the simulator. This optimized version of the simulator achieved an average speed-up of 310 compared to the non-algorithm based version of the simulator.


2011 ◽  
Vol 60 (10) ◽  
pp. 1511-1516 ◽  
Author(s):  
Pedro Reviriego ◽  
Chris Bleakley ◽  
Juan Antonio Maestro ◽  
Anne O'Donnell

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