FIELD-EFFECT TRANSISTOR STRUCTURES WITH QUASI-ONE-DIMENSIONAL CHANNEL

2004 ◽  
Vol 03 (01n02) ◽  
pp. 161-170 ◽  
Author(s):  
SLAVA V. ROTKIN ◽  
HARRY E. RUDA ◽  
ALEXANDER SHIK

Drift–diffusion model is applied for transport in a one-dimensional field effect transistor. A unified description is given for a semiconductor nanowire and a single wall nanotube basing on a self-consistent electrostatic calculations. General analytic expressions are found for basic device characteristic which differ from those for bulk transistors. We explain the difference in terms of weaker screening and specific charge density distribution in quasi-one-dimensional channel. The device characteristics are shown to be sensitive to the geometry of leads and are analyzed separately for bulk, planar and wire contacts.

1997 ◽  
Vol 503 ◽  
Author(s):  
E. S. Kolesar ◽  
J. M. Wiseman

ABSTRACTAn interdigitated gate electrode field-effect transistor (IGEFET) was designed, fabricated and used to monitor the cure of a common epoxy. The IGEFET sensor consists of an interdigitated gate electrode structure which is coupled to the gate contact of a conventional metal-oxide-semiconductor field-effect transistor (MOSFET). The epoxy was deposited on the interdigitated gate electrode, and the IGEFET's electrical performance was observed as the epoxy cured. The cross-linking chemical reaction during epoxy cure caused electrical impedance changes that were quantified when the IGEFET was operated with a periodic voltage pulse signal. Charge transferred through the chemically-active epoxy is manifested as a temporally-dependent potential applied to the MOSFET's gate contact. By operating the MOSFET as a linear amplifier, a potential corresponding to the temporally-dependent gate voltage was directly measured at the amplifier's output. The Fourier transform of the IGEFET's time-domain response at specific time increments was computed. The resulting epoxy cure spectra were compared to a reproducible baseline spectrum, and an ensemble of difference spectra were computed to reveal the epoxy's chemical state at specific instances of time. The difference spectra features yield valuable information concerning the state of the epoxy's cure.


1993 ◽  
Vol 63 (16) ◽  
pp. 2219-2221 ◽  
Author(s):  
J. H. Burroughes ◽  
M. L. Leadbeater ◽  
M. P. Grimshaw ◽  
R. J. Evans ◽  
D. A. Ritchie ◽  
...  

2015 ◽  
Vol 7 (1) ◽  
pp. 178-189
Author(s):  
Huei Chaeng Chin ◽  
Cheng Siong Lim ◽  
Kumeresan A. Danapalasingam ◽  
Vijay K. Arora ◽  
Michael Loong Peng Tan

2014 ◽  
Vol 104 (8) ◽  
pp. 083116 ◽  
Author(s):  
M. Ravaro ◽  
M. Locatelli ◽  
L. Viti ◽  
D. Ercolani ◽  
L. Consolino ◽  
...  

2010 ◽  
Vol 97 (23) ◽  
pp. 233505 ◽  
Author(s):  
E. Grémion ◽  
D. Niepce ◽  
A. Cavanna ◽  
U. Gennser ◽  
Y. Jin

Nanoscale ◽  
2014 ◽  
Vol 6 (12) ◽  
pp. 6828-6836 ◽  
Author(s):  
Yuchao Ma ◽  
Mengmeng Xue ◽  
Jiahua Shi ◽  
Yiwei Tan

A series of one-dimensional assemblies of semiconductor nanocrystals with enhanced field effect transistor performance has been studied.


1990 ◽  
Vol 57 (25) ◽  
pp. 2695-2697 ◽  
Author(s):  
J. Nieder ◽  
A. D. Wieck ◽  
P. Grambow ◽  
H. Lage ◽  
D. Heitmann ◽  
...  

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