scholarly journals Preparation of 0.055BaZrO3–0.935(K0.45Na0.5Li0.05)NbO3–0.01(Bi0.5Na0.5)TiO3 piezoelectric thin films from precursor solution by Pechini method

2017 ◽  
Vol 07 (02) ◽  
pp. 1750014 ◽  
Author(s):  
Liqiang Liu ◽  
Tomoaki Karaki ◽  
Tadashi Fujii ◽  
Yuichi Sakai
Keyword(s):  
Thin Films ◽  
Preparation Method ◽  
Pechini Method ◽  
Precursor Solution ◽  
Lead Free ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method ◽  
Si Substrates ◽  
Piezoelectric Thin Films

Lead-free piezoelectric thin films of 0.055BaZrO3–0.935(K[Formula: see text]Na[Formula: see text]Li[Formula: see text])NbO3–0.01(Bi[Formula: see text]Na[Formula: see text])TiO3 (BZ–KNLN–BNT) were fabricated on (100)-LaNiO3/SiO2/Si substrates. The Pechini (polymeric precursor) method was carried out to prepare the complicated multi-component precursor solution. This method was suited for controlling the complex components accurately. The films crystallized at 700[Formula: see text]C showed a (100)pc-oriented perovskite structure, whose grain size was about 200[Formula: see text]nm and thickness was about 700[Formula: see text]nm. The Curie temperature [Formula: see text]c of the films was 292[Formula: see text]C that was near to that of the bulk ceramics. The preparation method used in this work provided a possibility for the application of multi-component lead-free piezoelectric films.

Crystallization kinetic and structural characterization of lead-free piezoelectric 0.94(Na0.5Bi0.5)TiO3-0.06BaTiO3 by polymeric precursor method

2021 ◽  
pp. 125494
Author(s):  
Gislayne Rayane Alves da Silva ◽  
Claudia Patrícia Fernandez Perdomo ◽  
Rodolfo Foster Klein Gunnewiek ◽  
Ruth Herta Goldschmidt Aliaga Kiminami
Keyword(s):  
Structural Characterization ◽  
Crystallization Kinetic ◽  
Lead Free ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method

Preparation of KNbO3 Powder by Modified Pechini Method from Layered Perovskite Aqueous Solution

2008 ◽  
Vol 368-372 ◽  
pp. 1883-1885 ◽  
Author(s):  
Takafumi Kokubo ◽  
Kenichi Kakimoto ◽  
Hitoshi Ohsato
Keyword(s):  
Crystal Structure ◽  
Pechini Method ◽  
Layered Perovskite ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method ◽  
Thermal Decomposition Behavior ◽  
Modified Pechini Method ◽  
Ft Ir ◽  
Decomposition Behavior

KNbO3 (KN) powder was synthesized by modified Pechini method (polymeric precursor method). KN powder with different crystal structure and grain size distribution was synthesized by different drying temperature. In this paper, the mechanism of preparation of KN powder was discussed in thermal decomposition behavior. The obtained powder was characterized by XRD, TEM, FT-IR and TG-DTA.

Effect of Thermal Treatment on the Morphology of PLZT Thin Films Prepared from Polymeric Precursor Method

2001 ◽  
Vol 189-191 ◽  
pp. 155-160 ◽  
Author(s):  
A.H.M. González ◽  
A.Z. Simões ◽  
José Arana Varela ◽  
M.A. Zaghete ◽  
Elson Longo
Keyword(s):  
Thin Films ◽  
Thermal Treatment ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method ◽  
Plzt Thin Films

scholarly journals Microstructure and dielectric properties of (Ba,Sr)TiO3 thin film produced by the polymeric precursor method

2000 ◽  
Vol 15 (5) ◽  
pp. 1176-1181 ◽  
Author(s):  
F. M. Pontes ◽  
E. B. Araujo ◽  
E. R. Leite ◽  
J. A. Eiras ◽  
E. Longo ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Spin Coating ◽  
Dissipation Factor ◽  
Heating Process ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method ◽  
Chemical Homogeneity ◽  
Bst Thin Films

BaxSr1−xTiO3 (x 4 0.6) (BST) thin films were successfully prepared on a Pt(111)/TiO2/SiO2/Si(100) substrate by spin coating, using the polymeric precursor method. BST films with a perovskite single phase were obtained after heat treatment at 700 °C. The multilayer BST thin films had a granular structure with a grain size of approximately 60 nm. A 480-nm-thick film was obtained by carrying out five cycles of the spin-coating/heating process. Scanning electron microscopy and atomic force microscopy analyses showed that the thin films had a smooth, dense, crack-free surface with low surface roughness (3.6 nm). At room temperature and at a frequency of 100 kHz, the dielectric constant and the dissipation factor were, respectively, 748 and 0.042. The high dielectric constant value was due to the high microstructural quality and chemical homogeneity of the thin films obtained by the polymeric precursor method.

scholarly journals Retention characteristics in Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method

2005 ◽  
Vol 86 (11) ◽  
pp. 112909 ◽  
Author(s):  
A. Z. Simões ◽  
M. A. Ramirez ◽  
N. A. Perruci ◽  
C. S. Riccardi ◽  
E. Longo ◽  
...  
Keyword(s):  
Thin Films ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method ◽  
Retention Characteristics

scholarly journals Fatigue-free behavior of Bi3.25La0.75Ti3O12 thin films grown on several bottom eletrodes by the polymeric precursor method

2004 ◽  
Vol 85 (24) ◽  
pp. 5962-5964 ◽  
Author(s):  
A. Z. Simões ◽  
A. Ries ◽  
F. M. Filho ◽  
C. S. Riccardi ◽  
J. A. Varela ◽  
...  
Keyword(s):  
Thin Films ◽  
Polymeric Precursor Method ◽  
Polymeric Precursor ◽  
Precursor Method ◽  
Free Behavior
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