Three-Dimensional Structure Analysis of Metal–Oxide–Insulator Field Effect Transistors with Different Electrical Properties by Scanning Transmission Electron Microscopy
2006 ◽
Vol 106
(11-12)
◽
pp. 1062-1068
◽
2011 ◽
Vol 174
(3)
◽
pp. 552-562
◽
2004 ◽
Vol 84
(25-26)
◽
pp. 2819-2828
◽
1988 ◽
Vol 107
(2)
◽
pp. 597-611
◽