Direct determination of strain and composition in InGaAs nano-islands using anomalous grazing incidence x-ray diffraction
2004 ◽
Vol 36
(1-3)
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pp. 11-19
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2007 ◽
Vol 40
(5)
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pp. 874-882
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1994 ◽
Vol 89
(7)
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pp. 583-586
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1987 ◽
Vol 26
(Part 1, No. 1)
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pp. 157-161
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1983 ◽
Vol 50
(15)
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pp. 1145-1148
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