Auger Electron Spectroscopy Study on the Stability and the Interfacial Reaction of Ta, Ta-N and TaN Films as a Diffusion Barrier between Cu9Al4Film and Si

1993 ◽  
Vol 32 (Part 1, No. 2) ◽  
pp. 911-915 ◽  
Author(s):  
Atsushi Noya ◽  
Katsutaka Sasaki ◽  
Mayumi Takeyama
1989 ◽  
Vol 23 (11) ◽  
pp. 1969-1973 ◽  
Author(s):  
I. Baker ◽  
R.A. Padgett ◽  
E.M. Schulson

2006 ◽  
Vol 83 (1) ◽  
pp. 12-16 ◽  
Author(s):  
J.H. Xia ◽  
Rusli ◽  
S.F. Choy ◽  
R. Gopalakrishan ◽  
C.C. Tin ◽  
...  

1986 ◽  
Vol 168 (1-3) ◽  
pp. 681-687 ◽  
Author(s):  
C. Fontaine ◽  
J.L. Castano ◽  
J. Castagné ◽  
A. Munoz-Yague

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