Strained Lattice Structure Analysis of InGaAsP Multilayers Using Thickness Fringes in Transmission Electron Microscopy Images
1995 ◽
Vol 34
(Part 1, No. 4A)
◽
pp. 1784-1789
2017 ◽
Vol 3
(1)
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2016 ◽
pp. 75-76
2011 ◽
Vol 245
(2)
◽
pp. 140-147
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2013 ◽
Vol 62
(12)
◽
pp. 3231-3242
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2008 ◽
Vol 112
(6)
◽
pp. 1759-1763
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Technical note: Using k-means to identify soot aggregates in transmission electron microscopy images
2021 ◽
Vol 152
◽
pp. 105699
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