Experimental Analysis of Velocity Overshoot Degradation in Sub-0.1 µm Fully-Depleted SOI-MOSFETs

1997 ◽  
Vol 36 (Part 1, No. 3B) ◽  
pp. 1543-1547 ◽  
Author(s):  
Ryuji Ohba ◽  
Tomohisa Mizuno
2015 ◽  
Author(s):  
Aaron S. Richmond ◽  
Jared Becknell ◽  
Jeanne M. Slattery ◽  
Robin Morgan ◽  
Nathanael Mitchell

1984 ◽  
Author(s):  
Henry H. Emurian ◽  
Joseph V. Brady ◽  
Ronald L. Ray ◽  
James L. Meyerhoff ◽  
Edward H. Mougey

Sign in / Sign up

Export Citation Format

Share Document