Experimental Analysis of Velocity Overshoot Degradation in Sub-0.1 µm Fully-Depleted SOI-MOSFETs
1997 ◽
Vol 36
(Part 1, No. 3B)
◽
pp. 1543-1547
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1997 ◽
Vol 36
(Part 1, No. 3A)
◽
pp. 1015-1024
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2018 ◽
Vol 18
(2)
◽
pp. 184-192
◽
2018 ◽
Vol 18
(2)
◽
pp. 124-133
◽