Determination of the Mass Resolution and the Depth Resolution of Time of Flight Elastic Recoil Detection Analysis Using Heavy Ion Beams

1997 ◽  
Vol 36 (Part 1, No. 9A) ◽  
pp. 5737-5740 ◽  
Author(s):  
Wan Hong ◽  
Shinjiro Hayakawa ◽  
Kuniko Maeda ◽  
Shigekazu Fukuda ◽  
Minoru Yanokura ◽  
...  
Keyword(s):  
Time Of Flight ◽  
Depth Resolution ◽  
Heavy Ion ◽  
Ion Beams ◽  
Mass Resolution ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis

Light element analysis in steel by high–energy heavy–ion time of flight elastic recoil detection analysis

1999 ◽  
Vol 54 (1) ◽  
pp. 151-157
Author(s):  
Wan Hong ◽  
Shinjiro Hayakawa ◽  
Kuniko Maeda ◽  
Shigekazu Fukuda ◽  
Yohichi Gohshi
Keyword(s):  
Time Of Flight ◽  
Light Element ◽  
Heavy Ion ◽  
High Energy ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Element Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis

A combined segmented anode gas ionization chamber and time-of-flight detector for heavy ion elastic recoil detection analysis

2016 ◽  
Vol 87 (10) ◽  
pp. 103303 ◽  
Author(s):  
Petter Ström ◽  
Per Petersson ◽  
Marek Rubel ◽  
Göran Possnert
Keyword(s):  
Ionization Chamber ◽  
Time Of Flight ◽  
Heavy Ion ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis ◽  
Gas Ionization

Time detector design for Time-of-Flight Elastic Recoil Detection Analysis (ToF-E ERDA)

2019 ◽  
Vol 450 ◽  
pp. 385-389
Author(s):  
Harry J. Whitlow ◽  
Patrick Jeanneret ◽  
Edouard Guibert ◽  
Liping Wang ◽  
Mathijs Van Der Meer
Keyword(s):  
Time Of Flight ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis ◽  
Detector Design

Iodine Induced Damage in Semiconductor Materials During Heavy Ion Recoil Elastic Recoil Detection Analysis

1996 ◽  
pp. 849-852
Author(s):  
Scott R. WALKER ◽  
Peter N. JOHNSTON ◽  
Ian F. BUBB ◽  
Warren B. STANNARD ◽  
David N. JAMIESON ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Semiconductor Materials ◽  
Elastic Recoil ◽  
Elastic Recoil Detection Analysis ◽  
Elastic Recoil Detection ◽  
Detection Analysis

scholarly journals Time-Of-Flight ERDA for Depth Profiling of Light Elements

2020 ◽  
Vol 4 (4) ◽  
pp. 40
Author(s):  
Keisuke Yasuda
Keyword(s):  
Ion Beam ◽  
Time Of Flight ◽  
Depth Profiling ◽  
Depth Resolution ◽  
Semiconductor Detectors ◽  
Light Elements ◽  
Elastic Recoil ◽  
Measurement Sensitivity ◽  
Elastic Recoil Detection ◽  
Detection Analysis

The time-of-flight elastic recoil detection analysis (TOF-ERDA) method is one of the ion beam analysis methods that is capable of analyzing light elements in a sample with excellent depth resolution. In this method, simultaneous measurements of recoil ion energy and time of flight are performed, and ion mass is evaluated. The energy of recoil ions is calculated from TOF, which gives better energy resolution than conventional Silicon semiconductor detectors (SSDs). TOF-ERDA is expected to be particularly applicable for the analysis of light elements in thin films. In this review, the principle of TOF-ERDA measurement and details of the measurement equipment along with the performance of the instrumentation, including depth resolution and measurement sensitivity, are described. Examples of TOF-ERDA analysis are presented with a focus on the results obtained from the measurement system developed by the author.

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